{"created":"2023-05-15T14:59:02.106638+00:00","id":80095,"links":{},"metadata":{"_buckets":{"deposit":"f8c78efc-e1a2-4b20-8584-27f724694456"},"_deposit":{"created_by":1,"id":"80095","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"80095"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00080095","sets":["2"]},"author_link":["898818","898820","898819","898824","898821","898822","898815","898814","898823","898816","898812","898813","898817"],"item_10003_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2020-06","bibliographicIssueDateType":"Issued"},"bibliographic_titles":[{"bibliographic_title":"Radiation and its Effects on Components and Systems 2020 (RADECS 2020) proceeding"}]}]},"item_10003_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"  The single event effects (SEEs) characteristics on 14/16-nm bulk Fin Field-Effect Transistors (FinFETs) were investigated in terms of single bit upsets (SBUs) and multiple cell upsets (MCUs). The sensitive area estimation based on the cross-section are also discussed.","subitem_description_type":"Abstract"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Takeuchi, Kozo"}],"nameIdentifiers":[{"nameIdentifier":"898812","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kato, Takashi"}],"nameIdentifiers":[{"nameIdentifier":"898813","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sakamoto, Keita"}],"nameIdentifiers":[{"nameIdentifier":"898814","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yukumatsu, Kazuki"}],"nameIdentifiers":[{"nameIdentifier":"898815","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Watanabe, Kyota"}],"nameIdentifiers":[{"nameIdentifier":"898816","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tsuchiya, Yuta"}],"nameIdentifiers":[{"nameIdentifier":"898817","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Matsuyama, Hideya"}],"nameIdentifiers":[{"nameIdentifier":"898818","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Takeyama, Akinori"}],"nameIdentifiers":[{"nameIdentifier":"898819","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ohshima, Takeshi"}],"nameIdentifiers":[{"nameIdentifier":"898820","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kuboyama, Satoshi"}],"nameIdentifiers":[{"nameIdentifier":"898821","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Shindo, Hiroyuki"}],"nameIdentifiers":[{"nameIdentifier":"898822","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Takeyama, Akinori","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"898823","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ohshima, Takeshi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"898824","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Characteristic Charge Collection Mechanism Observed in FinFET SRAM cells","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Characteristic Charge Collection Mechanism Observed in FinFET SRAM cells"}]},"item_type_id":"10003","owner":"1","path":["2"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-06-17"},"publish_date":"2020-06-17","publish_status":"0","recid":"80095","relation_version_is_last":true,"title":["Characteristic Charge Collection Mechanism Observed in FinFET SRAM cells"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T21:20:12.863655+00:00"}