{"created":"2023-05-15T14:58:41.185542+00:00","id":79618,"links":{},"metadata":{"_buckets":{"deposit":"0912bbae-19c6-4da4-af94-0ba13b99d70b"},"_deposit":{"created_by":1,"id":"79618","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"79618"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00079618","sets":["1"]},"author_link":["1004634","1004633","1004630","1004645","1004625","1004623","1004636","1004639","1004627","1004631","1004626","1004644","1004621","1004643","1004624","1004640","1004628","1004629","1004622","1004641","1004620","1004642","1004632","1004635","1004637","1004638"],"item_8_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2020-03","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"153","bibliographicPageStart":"146","bibliographicVolumeNumber":"67","bibliographic_titles":[{"bibliographic_title":"IEEE TRANSACTIONS ON NUCLEAR SCIENCE"}]}]},"item_8_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The response of a 5-µm-thin silicon on insulator (SOI) 3-D microdosimeter was investigated for single-event\nupset applications by measuring the linear energy transfer (LET)\nof different high LET ions. The charge collection characteristics\nof the device were performed using the ion beam-induced\ncharge collection (IBIC) technique with 3- and 5.5-MeV He2+\nions incident on the microdosimeter. The microdosimeter was\nirradiated with 16O, 56Fe, and 124Xe ions and was able to\ndetermine the LET within 5% for most configurations apart\nfrom 124Xe. It was observed that on average, measured LET was\n12% lower for 30-MeV/u 124Xe ion traversing through different\nthickness Kapton absorbers in comparison to Geant4 simulations.\nThis discrepancy can be partly attributed to uncertainties in\nthe thickness of the energy degraders and the thickness of the\nSOI layer of the devices. The effects of overlayer thickness\nvariation are not easily observed for ions with much lower LET\nas O and Fe. Based on that, it is difficult to make conclusion\nthat the plasma effect is observed for 30-MeV/u124Xe ions and\nfurther research to be carried out for ion with LET higher than\n12 MeV/µm.","subitem_description_type":"Abstract"}]},"item_8_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1109/TNS.2019.2939355","subitem_relation_type_select":"DOI"}}]},"item_8_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://ieeexplore.ieee.org/document/8823950","subitem_relation_type_select":"URI"}}]},"item_8_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0018-9499","subitem_source_identifier_type":"ISSN"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"James, Benjamin"}],"nameIdentifiers":[{"nameIdentifier":"1004620","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Linh Tran, Thuy"}],"nameIdentifiers":[{"nameIdentifier":"1004621","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"BOLST, David"}],"nameIdentifiers":[{"nameIdentifier":"1004622","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Peracchi, Stefania"}],"nameIdentifiers":[{"nameIdentifier":"1004623","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Davis, Jeremy"}],"nameIdentifiers":[{"nameIdentifier":"1004624","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Prokopovich, Anthony"}],"nameIdentifiers":[{"nameIdentifier":"1004625","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Guatelli, Susanna"}],"nameIdentifiers":[{"nameIdentifier":"1004626","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Petasecca, Marco"}],"nameIdentifiers":[{"nameIdentifier":"1004627","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Lerch, Michael"}],"nameIdentifiers":[{"nameIdentifier":"1004628","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Marco Povoli"}],"nameIdentifiers":[{"nameIdentifier":"1004629","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Angela Kok"}],"nameIdentifiers":[{"nameIdentifier":"1004630","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Marc-Jan, Goethem"}],"nameIdentifiers":[{"nameIdentifier":"1004631","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Nancarrow, Mitchell"}],"nameIdentifiers":[{"nameIdentifier":"1004632","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Matsufuji, Naruhiro"}],"nameIdentifiers":[{"nameIdentifier":"1004633","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Jackson, Michael"}],"nameIdentifiers":[{"nameIdentifier":"1004634","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Anatoly, Rozenfeld"}],"nameIdentifiers":[{"nameIdentifier":"1004635","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"James, Benjamin","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1004636","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Linh Tran, Thuy","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1004637","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"BOLST, David","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1004638","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Peracchi, Stefania","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1004639","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Davis, Jeremy","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1004640","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Prokopovich, Anthony","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1004641","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Petasecca, Marco","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1004642","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Lerch, Michael","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1004643","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Naruhiro, Matsufuji","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1004644","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Rozenfeld, Anatoly","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1004645","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"SOI Thin Microdosimeters for High LET Single-Event Upset Studies in Fe, O, Xe, and Cocktail Ion Beam Fields","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"SOI Thin Microdosimeters for High LET Single-Event Upset Studies in Fe, O, Xe, and Cocktail Ion Beam Fields"}]},"item_type_id":"8","owner":"1","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-03-23"},"publish_date":"2020-03-23","publish_status":"0","recid":"79618","relation_version_is_last":true,"title":["SOI Thin Microdosimeters for High LET Single-Event Upset Studies in Fe, O, Xe, and Cocktail Ion Beam Fields"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T19:26:31.475392+00:00"}