{"created":"2023-05-15T14:58:22.424913+00:00","id":79196,"links":{},"metadata":{"_buckets":{"deposit":"a379e273-a206-4bad-8570-d3e3d1349168"},"_deposit":{"created_by":1,"id":"79196","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"79196"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00079196","sets":["1"]},"author_link":["999246","999247","999245","999243","999248","999249","999253","999251","999250","999254","999255","999252","999258","999244","999256","999257"],"item_8_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2020-04","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"17","bibliographicPageStart":"14","bibliographicVolumeNumber":"468","bibliographic_titles":[{"bibliographic_title":"Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms"}]}]},"item_8_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We confirmed the effect of ion recombination using a parallel-plate ionization chamber: dose monitor for clinical use and the Advanced Markus chamber. A 290 MeV/u carbon-ion beam was irradiated using the continuous spot-scanning method in a field size of 5 cm by 5 cm with 2 mm spacing. We tested three beam intensities (1.35×10^8, 2.69×10^9, and 4.03×10^9 particle per second (pps)) at two linear energy transfers (12 keV/μm and 200 keV/μm). The charge (Q) was measured by changing the voltage of the Advanced Markus chamber and that of the dose monitor. Then, Boag’s method was used to calculate the saturated charge (Qsat ). For the Advanced Markus chamber, 300 V is a sufficient potential to collect charge. For the dose monitor, Qsat/Q at 2500 V was 1.024 for 4.03×10^9 pps, indicating that the general recombination correction cannot be ignored when high dose rate treatment is performed using a carbon-ion scanning beam.","subitem_description_type":"Abstract"}]},"item_8_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Elsevier"}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1016/j.nimb.2020.02.007","subitem_relation_type_select":"DOI"}}]},"item_8_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://www.sciencedirect.com/science/article/pii/S0168583X20300586?via%3Dihub","subitem_relation_type_select":"URI"}}]},"item_8_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0168-583X","subitem_source_identifier_type":"ISSN"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Sung-Hyun, Lee"}],"nameIdentifiers":[{"nameIdentifier":"999243","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tansho, Ryohei"}],"nameIdentifiers":[{"nameIdentifier":"999244","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Mizushima, Kota"}],"nameIdentifiers":[{"nameIdentifier":"999245","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Furukawa, Takuji"}],"nameIdentifiers":[{"nameIdentifier":"999246","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hara, Yousuke"}],"nameIdentifiers":[{"nameIdentifier":"999247","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Saraya, Yuichi"}],"nameIdentifiers":[{"nameIdentifier":"999248","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Saotome, Naoya"}],"nameIdentifiers":[{"nameIdentifier":"999249","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Shirai, Toshiyuki"}],"nameIdentifiers":[{"nameIdentifier":"999250","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sung-Hyun, Lee","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"999251","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ryohei, Tansho","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"999252","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kota, Mizushima","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"999253","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Takuji, Furukawa","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"999254","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yousuke, Hara","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"999255","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yuichi, Saraya","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"999256","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Naoya, Saotome","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"999257","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Toshiyuki, Shirai","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"999258","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Effect of general ion recombination on dose measurement for high dose rate carbon-ion scanning beam","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Effect of general ion recombination on dose measurement for high dose rate carbon-ion scanning beam"}]},"item_type_id":"8","owner":"1","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-03-04"},"publish_date":"2020-03-04","publish_status":"0","recid":"79196","relation_version_is_last":true,"title":["Effect of general ion recombination on dose measurement for high dose rate carbon-ion scanning beam"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T19:45:51.970032+00:00"}