@article{oai:repo.qst.go.jp:00079164,
 author = {松谷悠佑 and 中野敏彰 and 甲斐健師 and 鹿園直哉 and 赤松憲 and 吉井勇治 and 佐藤達彦 and Toshiaki, Nakano and Naoya, Shikazono and Ken, Akamatsu},
 issue = {5},
 journal = {International Journal of Molecular Sciences},
 month = {Mar},
 note = {Complex DNA damage, defined as at least two vicinal lesions within 10–20 base pairs (bp), induced after exposure to ionizing radiation, is recognized as fatal damage to human tissue. During this study, we propose a simplified cluster analysis of ionization and electronic excitation events within 10 bp based on track structure for estimating complex DNA damage yields for electron and X-ray irradiations. We then compare the computational results with the experimental complex DNA damage coupled with base damage (BD) measured by enzymatic cleavage and atomic force microscopy (AFM). The computational results agree well with experimental fractions of complex damage yields, i.e., single and double strand breaks (SSBs, DSBs) and complex BD, when the yield ratio of BD/SSB is assumed to be 1.3. The present simulation enables us to quantify the type of complex damage which cannot be measured through in vitro experiments and helps us to interpret the experimental detection efficiency for complex BD measured by AFM. This simple model for estimating complex DNA damage yields contributes to the precise understanding of the DNA damage complexity induced after X-ray and electron irradiations.},
 title = {A Simplified Cluster Analysis of Electron Track Structure for Estimating Complex DNA Damage Yields},
 volume = {21},
 year = {2020}
}