{"created":"2023-05-15T14:58:20.923107+00:00","id":79149,"links":{},"metadata":{"_buckets":{"deposit":"912da2ea-d908-49ee-84ee-f67615e0a680"},"_deposit":{"created_by":1,"id":"79149","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"79149"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00079149","sets":["1"]},"author_link":["1000340","1000350","1000346","1000343","1000347","1000348","1000341","1000344","1000342","1000345","1000349"],"item_8_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2019-04","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"164","bibliographicPageStart":"161","bibliographicVolumeNumber":"460","bibliographic_titles":[{"bibliographic_title":"Nuclear Instruments and Methods in Physics Research B"}]}]},"item_8_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"ポリメチルメタクリレート(PMMA)標的に0.12-0.54MeVのC60イオンを照射した際の二次負イオン放出特性を分析した結果を報告する。C60イオンパルスビームと飛行時間測定二次イオン質量分析法にイベント毎の測定モードを組み合わせることにより、C60イオン1個によって放出される二次負イオン数の確率分布及び特定の二次負イオン種について相対収量のエネルギー依存性を測定した。これらの分析により明らかになった二次負イオンの放出特性は、サブMeV級C60イオンによって標的中に形成されるイオントラックの構造(直径、長さ)によって説明できることがわかった。","subitem_description_type":"Abstract"}]},"item_8_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Elsevier B.V."}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1016/j.nimb.2019.02.001","subitem_relation_type_select":"DOI"}}]},"item_8_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://www.sciencedirect.com/science/article/pii/S0168583X19300722?via%3Dihub","subitem_relation_type_select":"URI"}}]},"item_8_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0168-583X","subitem_source_identifier_type":"ISSN"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"平田, 浩一(産総研)"}],"nameIdentifiers":[{"nameIdentifier":"1000340","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yamada, Keisuke"}],"nameIdentifiers":[{"nameIdentifier":"1000341","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Chiba, Atsuya"}],"nameIdentifiers":[{"nameIdentifier":"1000342","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hirano, Yoshimi"}],"nameIdentifiers":[{"nameIdentifier":"1000343","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Narumi, Kazumasa"}],"nameIdentifiers":[{"nameIdentifier":"1000344","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Saitoh, Yuichi"}],"nameIdentifiers":[{"nameIdentifier":"1000345","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Keisuke, Yamada","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1000346","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Atsuya, Chiba","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1000347","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yoshimi, Hirano","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1000348","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kazumasa, Narumi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1000349","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yuuichi, Saito","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1000350","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"0.12–0.54 MeV C60 ion impacts on a poly(methyl methacrylate) target: Characterization through emission properties of negative secondary ions","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"0.12–0.54 MeV C60 ion impacts on a poly(methyl methacrylate) target: Characterization through emission properties of negative secondary ions"}]},"item_type_id":"8","owner":"1","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-03-03"},"publish_date":"2020-03-03","publish_status":"0","recid":"79149","relation_version_is_last":true,"title":["0.12–0.54 MeV C60 ion impacts on a poly(methyl methacrylate) target: Characterization through emission properties of negative secondary ions"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T19:41:48.700309+00:00"}