{"created":"2023-05-15T14:57:51.309421+00:00","id":78477,"links":{},"metadata":{"_buckets":{"deposit":"bbf2d482-30e6-492a-bfa5-2000c9843893"},"_deposit":{"created_by":1,"id":"78477","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"78477"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00078477","sets":["1"]},"author_link":["1070717","1070714","1070712","1070711","1070716","1070710","1070713","1070715"],"item_8_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2019-08","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"303","bibliographicPageStart":"297","bibliographicVolumeNumber":"82","bibliographic_titles":[{"bibliographic_title":"日本写真学会誌"}]}]},"item_8_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"高解像度の原子核乾板に記録された放射線飛跡は微小な現像銀微粒子からなり，これらは光学顕微鏡の分解能より小さくなると検出困難である．この現像銀粒子が落射光学系の光学顕微鏡では，局在表面プラズモン共鳴（Localized Surface Plasmon Resonance; LSPR）による輝点として観察できることから，ここでは電子顕微鏡と光学顕微鏡で同じエリアを観察して，検出しうる粒子サイズと間隔を解析した．単独では50 nm サイズの粒子も輝点として検出できた．さらに偏光照射により輝点の輝度や色が偏光の回転角に応じて変化することから，接近した粒子も区別しうることが示唆された．さらに光学的手法の改良による解像度，コントラストの向上も探った．LSPR を用いた飛跡検出法は，高い分解能とともに，偏光情報･色情報など多くの情報を与え，今後の放射線飛跡解析への有力な手段となりうる．","subitem_description_type":"Abstract"}]},"item_8_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"一般社団法人日本写真学会"}]},"item_8_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0369-5662","subitem_source_identifier_type":"ISSN"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"久下, 謙一"}],"nameIdentifiers":[{"nameIdentifier":"1070710","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"安達, 考洋"}],"nameIdentifiers":[{"nameIdentifier":"1070711","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"梅本, 篤宏"}],"nameIdentifiers":[{"nameIdentifier":"1070712","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"中, 竜大"}],"nameIdentifiers":[{"nameIdentifier":"1070713","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小平, 聡"}],"nameIdentifiers":[{"nameIdentifier":"1070714","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kenichi, Kuge","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1070715","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tatuhiro, Naka","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1070716","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Satoshi, Kodaira","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1070717","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"局在表面プラズモン共鳴を用いた光学顕微鏡による微細放射線飛跡解析法","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"局在表面プラズモン共鳴を用いた光学顕微鏡による微細放射線飛跡解析法"}]},"item_type_id":"8","owner":"1","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-01-21"},"publish_date":"2020-01-21","publish_status":"0","recid":"78477","relation_version_is_last":true,"title":["局在表面プラズモン共鳴を用いた光学顕微鏡による微細放射線飛跡解析法"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T16:45:34.656836+00:00"}