@misc{oai:repo.qst.go.jp:00078273,
 author = {Niethammer, Matthias and Widmann, Matthias and Rendler, Torsten and Morioka, Naoya and Chen Chen, Yu and Rainer, Stöhr and al Hassan, Jawad and Onoda, Shinobu and Ohshima, Takeshi and Sang-Yun, Lee and Mukherjee, Amlan and Isoya, Junichi and Tien Son, Nguyen and Jörg, Wrachtrup and Onoda, Shinobu and Ohshima, Takeshi},
 month = {Oct},
 note = {Coherent Electrical Readout of Spin-Active Defects in 4H-SiC for Quantum Sensors using Photo-Ionization at Ambient Conditions is presented., International Conference on Silicon Carbide and Related Materials 2019},
 title = {Coherent Electrical Readout of Spin-Active Defects in 4H-SiC for Quantum Sensors using Photo-Ionization at Ambient Conditions},
 year = {2019}
}