{"created":"2023-05-15T14:57:15.595595+00:00","id":77702,"links":{},"metadata":{"_buckets":{"deposit":"ee412a61-2ee4-4f1e-a718-67dd67e097bb"},"_deposit":{"created_by":1,"id":"77702","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"77702"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00077702","sets":["1"]},"author_link":["1001332","1001328","1001329","1001333","1001338","1001336","1001335","1001331","1001339","1001337","1001334","1001330"],"item_8_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2019-08","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"5","bibliographicPageStart":"4200604 ","bibliographicVolumeNumber":"29","bibliographic_titles":[{"bibliographic_title":"IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY"}]}]},"item_8_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"For inter-double-pancake joints of ITER TF it is required to achieve sufficiently low joint resistance (R-J), as 3 n Omega, to reduce Joule heating during operation with a background field of 2 T and nominal current of 68 kA. If R-J value is measured directly, a large cryostat is required to cool down the TF coil with huge mass and size during R-J measurement at 4 K. As alternative, authors have developed new inspection methods to obtain R-J value. The contributions to R-J can be divided mainly into contact resistance between the copper sole and cable (R-c) and resistance of soldered region between copper soles (R-sol). For the measurement of the former, the authors developed the inspection method in a past study. In this paper, the authors focus on the development of a measurement method for the latter. If there is a defect in the soldered region, a current distribution in the copper sole varies from the case of no defect, resulting in a change in the voltage profile along the copper sole. Thus, the voltage profile along the copper sole is measured at room temperature by supplying 20 A to the termination. To confirm the sensitivity to existence of a defect in soldered region, the measurements were performed for good (no-defect) and bad (defect) joints. An example of good joint was a joint sample the R-J value of which was sufficiently low, while had joint was simulated by artificially isolating a part of the soldered region. From the results of the measurements, a significant difference was observed between good and bad joint samples. Thus, it can be concluded that the developed method is practically effective for inspection of soldering quality between copper soles.","subitem_description_type":"Abstract"}]},"item_8_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1109/TASC.2019.2899661","subitem_relation_type_select":"DOI"}}]},"item_8_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://ieeexplore.ieee.org/document/8642920/authors#authors","subitem_relation_type_select":"URI"}}]},"item_8_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1051-8223","subitem_source_identifier_type":"ISSN"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kajitani, Hideki"}],"nameIdentifiers":[{"nameIdentifier":"1001328","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Nakamoto, Mio"}],"nameIdentifiers":[{"nameIdentifier":"1001329","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kasai, Yuma"}],"nameIdentifiers":[{"nameIdentifier":"1001330","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yamane, Minoru"}],"nameIdentifiers":[{"nameIdentifier":"1001331","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Matsui, Kunihiro"}],"nameIdentifiers":[{"nameIdentifier":"1001332","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Koizumi, Norikiyo"}],"nameIdentifiers":[{"nameIdentifier":"1001333","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hideki, Kajitani","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1001334","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Mio, Nakamoto","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1001335","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yuma, Kasai","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1001336","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Minoru, Yamane","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1001337","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kunihiro, Matsui","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1001338","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Norikiyo, Koizumi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1001339","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"New Inspection Method of Soldering Region at Room Temperature for ITER TF Termination ","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"New Inspection Method of Soldering Region at Room Temperature for ITER TF Termination "}]},"item_type_id":"8","owner":"1","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2019-11-25"},"publish_date":"2019-11-25","publish_status":"0","recid":"77702","relation_version_is_last":true,"title":["New Inspection Method of Soldering Region at Room Temperature for ITER TF Termination "],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T19:38:06.707322+00:00"}