{"created":"2023-05-15T14:57:05.571081+00:00","id":77473,"links":{},"metadata":{"_buckets":{"deposit":"aeabe9e4-4567-40b5-9de8-c320887ea3ea"},"_deposit":{"created_by":1,"id":"77473","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"77473"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00077473","sets":["1"]},"author_link":["1070707","1070708","1070705","1070703","1070709","1070706","1070702","1070701","1070704","1070700"],"item_8_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2019-11","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2-3","bibliographicPageEnd":"223","bibliographicPageStart":"219","bibliographicVolumeNumber":"186","bibliographic_titles":[{"bibliographic_title":"Radiation Protection dosimetry"}]}]},"item_8_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Track-etched detectors are commonly used also for radiation monitoring onboard International Space Station. To be registered in track-etched detectors, the particle needs to meet several criteria—it must have linear energy transfer above the detection threshold and strike the detector’s surface under an angle higher than the so-called critical angle. Linear energy transfer is then estimated from calibration curve from the etch rate ratio V that is calculated from parameters of individual tracks appearing on the detector’s surface after chemical etching. It has been observed that can depend on the incident angle and this dependence can vary for different detector materials, etching and evaluating conditions. To investigate angular dependence, detectors (Harzlas\nTD-1) were irradiated at HIMAC by several ions under angles from 0◦ to 90◦. The correction accounting not only for critical angle but also for dependence of V on the incident angle is introduced and applied to spectra measured onboard International Space Station.","subitem_description_type":"Abstract"}]},"item_8_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Oxford Academic"}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1093/rpd/ncz206","subitem_relation_type_select":"DOI"}}]},"item_8_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1093/rpd/ncz206","subitem_relation_type_select":"DOI"}}]},"item_8_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0144-8420","subitem_source_identifier_type":"ISSN"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Iva, Ambrozova"}],"nameIdentifiers":[{"nameIdentifier":"1070700","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Pachnerova, Brabcova"}],"nameIdentifiers":[{"nameIdentifier":"1070701","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Shurshakov, Vyacheslav"}],"nameIdentifiers":[{"nameIdentifier":"1070702","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tolochek, Raisa"}],"nameIdentifiers":[{"nameIdentifier":"1070703","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kodaira, Satoshi"}],"nameIdentifiers":[{"nameIdentifier":"1070704","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Iva, Ambrozova","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1070705","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Pachnerova, Brabcova","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1070706","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Shurshakov, Vyacheslav","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1070707","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tolochek, Raisa","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1070708","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Satoshi, Kodaira","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1070709","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Angular dependence of track-etch detector HARZLAS TD-1","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Angular dependence of track-etch detector HARZLAS TD-1"}]},"item_type_id":"8","owner":"1","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2019-11-18"},"publish_date":"2019-11-18","publish_status":"0","recid":"77473","relation_version_is_last":true,"title":["Angular dependence of track-etch detector HARZLAS TD-1"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T16:45:37.289350+00:00"}