{"created":"2023-05-15T14:56:58.773348+00:00","id":77324,"links":{},"metadata":{"_buckets":{"deposit":"0217cdc2-35e1-4e4b-9d04-b620e0c0b2a9"},"_deposit":{"created_by":1,"id":"77324","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"77324"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00077324","sets":["10:28"]},"author_link":["798927","798928"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2019-10-30","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Abstract—In this study, we perform on-beam monitoring of 718 keV prompt gammas emissions due to interaction of Carbon ion beams with the target phantom. Carbon ion beams at a clinical situation, generated in Gunma University Heavy Ion Medical Center, Japan, were used. A Silicon/CadmiumTelluride detector based Compton camera was used for gamma events detection and a simple back projection algorithm was used to develop Compton images. Beam monitoring experiments were conducted using Carbon ion beams of 290 MeV/u irradiated on a polymethyl methacrylate phantom. The energy spectrum obtained through the Compton camera shows the energy peaks 718 keV gamma ray events. We were able to develop Compton images using 718 keV gamma events and were suitable for further statistical analysis. Though the intensity of 718 keV prompt gammas were low, however could provide valuable information regarding on-beam monitoring.","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"2019 IEEE Nuclear Science Symposium and Medical Imaging Conference (2019 IEEE-NSS-MIC)","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Parajuli, Raj"}],"nameIdentifiers":[{"nameIdentifier":"798927","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Parajuli, Raj","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"798928","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"On-Beam Imaging of 718 keV Prompt Gamma using Si/CdTe Compton Camera for Carbon Ion Beam","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"On-Beam Imaging of 718 keV Prompt Gamma using Si/CdTe Compton Camera for Carbon Ion Beam"}]},"item_type_id":"10005","owner":"1","path":["28"],"pubdate":{"attribute_name":"公開日","attribute_value":"2019-11-06"},"publish_date":"2019-11-06","publish_status":"0","recid":"77324","relation_version_is_last":true,"title":["On-Beam Imaging of 718 keV Prompt Gamma using Si/CdTe Compton Camera for Carbon Ion Beam"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T23:50:40.617358+00:00"}