{"created":"2023-05-15T14:56:54.862243+00:00","id":77241,"links":{},"metadata":{"_buckets":{"deposit":"9739eb2f-d2ba-4c12-a315-beaa4bfcd3ac"},"_deposit":{"created_by":1,"id":"77241","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"77241"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00077241","sets":["10:28"]},"author_link":["796105","796107","796108","796106"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2019-08-02","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"大阪大学産業科学研究所のテラヘルツ自由電子レーザー(THz-FEL)の時間構造を計測のために、加速器高周波と同期したチタンサファイアレーザーを用いた電気光学(EO)サンプリング計測を実施している。これまでのところ、EOサンプリング信号にはショットごとの変動が見られているが、パルストレイン内の変動には特定の変動周期が現れている。この物理的要因を究明するために、様々な動作条件でのEO計測信号に対して周波数解析を実施している。本発表では、この研究に関する概要と現状を報告する。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第16回日本加速器学会年会","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"川瀬, 啓悟"}],"nameIdentifiers":[{"nameIdentifier":"796105","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"誉田, 義英"}],"nameIdentifiers":[{"nameIdentifier":"796106","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"磯山, 悟朗"}],"nameIdentifiers":[{"nameIdentifier":"796107","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kawase, Keigo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"796108","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"産研THz-FELにおけるEO計測の周波数解析","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"産研THz-FELにおけるEO計測の周波数解析"}]},"item_type_id":"10005","owner":"1","path":["28"],"pubdate":{"attribute_name":"公開日","attribute_value":"2019-05-17"},"publish_date":"2019-05-17","publish_status":"0","recid":"77241","relation_version_is_last":true,"title":["産研THz-FELにおけるEO計測の周波数解析"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T23:54:57.092398+00:00"}