{"created":"2023-05-15T14:56:54.060458+00:00","id":77224,"links":{},"metadata":{"_buckets":{"deposit":"dbe07d03-6baf-46a8-a9ef-3206bbd84570"},"_deposit":{"created_by":1,"id":"77224","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"77224"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00077224","sets":["2"]},"author_link":["821823","821815","821822","821817","821821","821818","821816","821819","821820"],"item_10003_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2019-10","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"711","bibliographicPageStart":"709","bibliographic_titles":[{"bibliographic_title":"Proceedings of the 16th Annual Meeting of Particle Accelerator Society of Japan"}]}]},"item_10003_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"スポーク空洞は、周波数が同じならば楕円空洞よりサイズが小さく、さらにパッキングファクターにも優れている。このスポーク空洞の利点を生かしてERL 加速器を小型化し、LCS-γ/X線源を産業・学術分野への利用を図るため、\n超伝導スポーク空洞の開発を進めている。現在プレス加工したハーフスポークを使ってフルスポークにするための電子ビーム溶接試験を行っている。スポーク側面は複雑な曲線形状であり、さらにプレス成型による厚さ変化もあるため、溶接条件の最適化が重要である。溶接試験の現状について報告する。\n","subitem_description_type":"Abstract"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"沢村, 勝"}],"nameIdentifiers":[{"nameIdentifier":"821815","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"羽島, 良一"}],"nameIdentifiers":[{"nameIdentifier":"821816","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"佐伯学行"}],"nameIdentifiers":[{"nameIdentifier":"821817","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"岩下芳久"}],"nameIdentifiers":[{"nameIdentifier":"821818","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"頓宮, 拓"}],"nameIdentifiers":[{"nameIdentifier":"821819","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"中村哲朗"}],"nameIdentifiers":[{"nameIdentifier":"821820","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"渡邉直久"}],"nameIdentifiers":[{"nameIdentifier":"821821","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sawamura, Masaru","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"821822","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hajima, Ryoichi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"821823","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"超伝導スポーク空洞の電子ビーム溶接試験","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"超伝導スポーク空洞の電子ビーム溶接試験"}]},"item_type_id":"10003","owner":"1","path":["2"],"pubdate":{"attribute_name":"公開日","attribute_value":"2019-10-29"},"publish_date":"2019-10-29","publish_status":"0","recid":"77224","relation_version_is_last":true,"title":["超伝導スポーク空洞の電子ビーム溶接試験"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T23:16:56.850854+00:00"}