{"created":"2023-05-15T14:56:47.582529+00:00","id":77076,"links":{},"metadata":{"_buckets":{"deposit":"b39ff7ea-3dbf-43f1-b5a4-51ab5539ce1b"},"_deposit":{"created_by":1,"id":"77076","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"77076"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00077076","sets":["1"]},"author_link":["999278","999274","999275","999277","999276"],"item_8_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2019-10","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"030003-5","bibliographicPageStart":"030003-1","bibliographicVolumeNumber":"2160","bibliographic_titles":[{"bibliographic_title":"AIP Conference Proceedings"}]}]},"item_8_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A penning ionization gauge-type (PIG) ion source with one permanent magnet was designed and constructed for the installation of a MeV compact ion microbeam system. In the design of the ion source, the concept of the generation of high density small plasma confined by strong magnetic field in a small space was introduced to obtain a high brightness ion beam. As preliminary studies, the experiments of the separation of ion spices and ion beam brightness were performed on the generation of hydrogen ion beams. Our results show that diatomic hydrogen ion beams were mainly generated by the ion source. The ion beam brightness was experimentally evaluated to be 36.7 A/(m2srV), almost satisfying our goal.","subitem_description_type":"Abstract"}]},"item_8_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"AIP"}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1063/1.5127678","subitem_relation_type_select":"DOI"}}]},"item_8_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://aip.scitation.org/doi/10.1063/1.5127678","subitem_relation_type_select":"URI"}}]},"item_8_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0094-243X","subitem_source_identifier_type":"ISSN"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"石井, 保行"}],"nameIdentifiers":[{"nameIdentifier":"999274","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"大久保, 猛"}],"nameIdentifiers":[{"nameIdentifier":"999275","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"三宅, 善信(ビーム精工㈱)"}],"nameIdentifiers":[{"nameIdentifier":"999276","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yasuyuki, Ishii","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"999277","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Takeru, Okubo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"999278","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Prototype of a Penning ionization gauge type ion source with a permanent magnet for a MeV compact ion microbeam system","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Prototype of a Penning ionization gauge type ion source with a permanent magnet for a MeV compact ion microbeam system"}]},"item_type_id":"8","owner":"1","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2019-03-14"},"publish_date":"2019-03-14","publish_status":"0","recid":"77076","relation_version_is_last":true,"title":["Prototype of a Penning ionization gauge type ion source with a permanent magnet for a MeV compact ion microbeam system"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T19:45:44.900892+00:00"}