{"created":"2023-05-15T14:56:43.111473+00:00","id":76974,"links":{},"metadata":{"_buckets":{"deposit":"c472dd88-4db8-47c6-9480-675223c1fb69"},"_deposit":{"created_by":1,"id":"76974","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"76974"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00076974","sets":["10:28"]},"author_link":["788554","788548","788555","788551","788549","788550","788552","788547","788546","788553"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2019-11-08","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"ボロン（B、ホウ素）の軟X線発光を用いた状態分析は、自動車用高機能鋼材及びBWR・PWR原子炉材分析、農産物と土壌の分析、さらに半導体のドーパント分析、スピントロニクス・超電導材料開発などの分野で最近富に利用が拡大しているが、微量分析の目的には更なる分析強度の向上が望まれている。このため、表面物質がNiである軟X線回折格子表面上にランタン(La)系膜を堆積しB-K発光(6.76nm) において、受光量を増すため、従前より小さい入射角で回折効率を増大させる条件を探索した。試作した回折格子を放射光施設で測定した結果、LaF3およびLa / C膜を数十nm厚で堆積した回折格子を入射角が従前より約3°小さい84.20°で使用したとき、それぞれ27.8％および29.8％の回折効率を得た。電子顕微鏡に搭載の軟X線分光器による実機測定でも従来比で3倍以上の分析強度の向上を達成した。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"応用物理学会関西支部2019年度第2回講演会","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"小池, 雅人"}],"nameIdentifiers":[{"nameIdentifier":"788546","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"羽多野, 忠"}],"nameIdentifiers":[{"nameIdentifier":"788547","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"寺内, 正己"}],"nameIdentifiers":[{"nameIdentifier":"788548","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"高橋, 秀之"}],"nameIdentifiers":[{"nameIdentifier":"788549","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"村野, 孝訓"}],"nameIdentifiers":[{"nameIdentifier":"788550","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"高倉, 優"}],"nameIdentifiers":[{"nameIdentifier":"788551","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"長野, 哲也"}],"nameIdentifiers":[{"nameIdentifier":"788552","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"笹井, 浩行"}],"nameIdentifiers":[{"nameIdentifier":"788553","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"西原, 弘晃"}],"nameIdentifiers":[{"nameIdentifier":"788554","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Koike, Masato","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"788555","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"ボロンK発光(183eV)分光計測のためのランタン系膜付加による 高回折効率・広受光角軟X線ラミナー型回折格子の開発","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"ボロンK発光(183eV)分光計測のためのランタン系膜付加による 高回折効率・広受光角軟X線ラミナー型回折格子の開発"}]},"item_type_id":"10005","owner":"1","path":["28"],"pubdate":{"attribute_name":"公開日","attribute_value":"2019-09-30"},"publish_date":"2019-09-30","publish_status":"0","recid":"76974","relation_version_is_last":true,"title":["ボロンK発光(183eV)分光計測のためのランタン系膜付加による 高回折効率・広受光角軟X線ラミナー型回折格子の開発"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-16T00:05:45.591839+00:00"}