{"created":"2023-05-15T14:56:29.428017+00:00","id":76698,"links":{},"metadata":{"_buckets":{"deposit":"c0b3f13f-ad8c-41e4-9077-bb790ae71265"},"_deposit":{"created_by":1,"id":"76698","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"76698"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00076698","sets":["10:28"]},"author_link":["782224","782225","782221","782226","782220","782223","782222"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2019-09-04","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"本研究では、イオンマイクロビームの産業利用を目指して開発中の小型イオンマイクロビーム装置の要素技術として、小型・小電力な電磁石型PIGイオン源（emPIGイオン源）を開発している。このイオン源は、マイクロビーム形成に必要な低エネルギー、高輝度及び小エネルギー幅のイオンビームを発生するため、微小体積の高密度プラズマからイオンビームを引き出す方式である。これまでに、emPIGイオン源から300eV程度で高輝度な水素イオンビームが発生できることを実験的に示した。今回、もう一つの重要なビーム条件である小エネルギー幅のビームを発生するため、イオン源の引き出し電圧、水素ガス圧及び磁場強度を変えてエネルギー幅を静電並行平板型のエネルギー分析器により測定した。この結果、300eV程度の水素イオンビームで、6eV程度の最低エネルギー幅が得られ、ほぼ目標値を達成することができた。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"The 17th International Conference on Ion Sources","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Ishii, Yasuyuki"}],"nameIdentifiers":[{"nameIdentifier":"782220","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Okubo, Takeru"}],"nameIdentifiers":[{"nameIdentifier":"782221","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kashiwagi, Hirotsugu"}],"nameIdentifiers":[{"nameIdentifier":"782222","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yoshinobu, Miyake(㈱ビーム精工)"}],"nameIdentifiers":[{"nameIdentifier":"782223","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ishii, Yasuyuki","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"782224","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Okubo, Takeru","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"782225","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kashiwagi, Hirotsugu","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"782226","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"Measurement of Hydrogen Ion Beam Energy Spreads Generated by a Penning-Ionization-Gauge Type Ion Source with Electric Magnets for a MeV Compact Ion Microbeam System","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Measurement of Hydrogen Ion Beam Energy Spreads Generated by a Penning-Ionization-Gauge Type Ion Source with Electric Magnets for a MeV Compact Ion Microbeam System"}]},"item_type_id":"10005","owner":"1","path":["28"],"pubdate":{"attribute_name":"公開日","attribute_value":"2019-09-09"},"publish_date":"2019-09-09","publish_status":"0","recid":"76698","relation_version_is_last":true,"title":["Measurement of Hydrogen Ion Beam Energy Spreads Generated by a Penning-Ionization-Gauge Type Ion Source with Electric Magnets for a MeV Compact Ion Microbeam System"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-16T00:14:33.072229+00:00"}