@article{oai:repo.qst.go.jp:00076534,
 author = {Muraok, Kosuke and Sezak, Hiroshi and Ishikawa, Seiji and Maeda, Tomonori and Makino, Takahiro and Takeyama, Akinori and Ohshima, Takeshi and Shin-Ichiro Kuroki and Makino, Takahiro and Takeyama, Akinori and Ohshima, Takeshi},
 issue = {8},
 journal = {Japanese Journal of Applied Physics},
 month = {Aug},
 note = {4H-SiC n-channel metal oxide semiconductor field effect transistors (NMOSFETs) with a Ba-silicate interface layer were irradiated with gamma-rays up to 850 kGy at room temperature. Above 600 kGy, the field effect mobility increased from 12 to 18 cm2 V−1 s−1. The narrower channel in the
NMOSFETs enhanced radiation responses, such as mobility enhancement and threshold voltage shift. These results indicate that the edge of the channel significantly modifies the electrical characteristics.},
 pages = {081007-1--081007-7},
 title = {Gamma-ray irradiation-induced mobility enhancement of 4H-SiC NMOSFETs with a Ba-silicate interface layer},
 volume = {58},
 year = {2019}
}