@inproceedings{oai:repo.qst.go.jp:00076495,
 author = {Terauchi, Masami and Sato, Yohei and Takeda, Masatoshi and Hatano, Tadashi and Koike, Masato and Sasai, Hiroyuki and Nagano, Tetsuya and Koeda, Masaru and Murano, Takanori and Takahashi, Hideyuki and Koike, Masato},
 book = {Microscopy & Microanalysis},
 issue = {S1},
 month = {Aug},
 note = {Recently realized commercial X-ray fluorescence spectroscopy instrument for soft X-rays and extreme ultraviolet radiation, form 50 eV to 2000 eV, has a better or a comparable energy resolution with those of EPMA by using aberration corrected gratings and a two order better acquisition rate due to its parallel
detection system by using a CCD detector. Radiations in this energy range usually carry not only elemental but also chemical information, because those are generated by electronic transitions from valence bands (bonding electrons) to a shallow inner-shell core-hole state generated by an electron beam 
irradiation. Here, EPMA-SXES (JXA-8230 with SS-94000SXES) study on a correlation between distributions of doped-atom and doped carrier in Na-doped CaB6 bulk material is reported.},
 pages = {746--747},
 publisher = {Microscopy Society of America},
 title = {Non-uniform Distribution of Doped Carrier in a Na-doped CaB6 Bulk Material Observed by EPMA-SXES},
 volume = {24},
 year = {2018}
}