{"created":"2023-05-15T14:56:17.159626+00:00","id":76447,"links":{},"metadata":{"_buckets":{"deposit":"50d8a1b9-fd1d-4124-99fa-c80e56f410f7"},"_deposit":{"created_by":1,"id":"76447","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"76447"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00076447","sets":["10:28"]},"author_link":["774441","774443","774442","774444","774447","774439","774440","774445","774446"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2019-08-01","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"スポーク空洞は、周波数が同じならば楕円空洞よりサイズが小さく、さらにパッキングファクターにも優れている。このスポーク空洞の利点を生かしてERL 加速器を小型化し、LCS-γ/X線源を産業・学術分野への利用を図るため、\n超伝導スポーク空洞の開発を進めている。現在プレス加工したハーフスポークを使ってフルスポークにするための電子ビーム溶接試験を行っている。スポーク側面は複雑な曲線形状であり、さらにプレス成型による厚さ変化もあるため、溶接条件の最適化が重要である。溶接試験の現状について報告する。\n","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第16回日本加速器学会年会","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"沢村, 勝"}],"nameIdentifiers":[{"nameIdentifier":"774439","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"羽島, 良一"}],"nameIdentifiers":[{"nameIdentifier":"774440","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"佐伯学行"}],"nameIdentifiers":[{"nameIdentifier":"774441","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"岩下芳久"}],"nameIdentifiers":[{"nameIdentifier":"774442","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"頓宮, 拓"}],"nameIdentifiers":[{"nameIdentifier":"774443","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"中村哲朗"}],"nameIdentifiers":[{"nameIdentifier":"774444","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"渡邉直久"}],"nameIdentifiers":[{"nameIdentifier":"774445","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sawamura, Masaru","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"774446","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hajima, Ryoichi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"774447","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"超伝導スポーク空洞の電子ビーム溶接試験","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"超伝導スポーク空洞の電子ビーム溶接試験"}]},"item_type_id":"10005","owner":"1","path":["28"],"pubdate":{"attribute_name":"公開日","attribute_value":"2019-05-10"},"publish_date":"2019-05-10","publish_status":"0","recid":"76447","relation_version_is_last":true,"title":["超伝導スポーク空洞の電子ビーム溶接試験"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-16T00:23:50.174585+00:00"}