{"created":"2023-05-15T14:54:55.488937+00:00","id":74630,"links":{},"metadata":{"_buckets":{"deposit":"7f720680-9edb-48a4-bc33-fecd801801a7"},"_deposit":{"created_by":1,"id":"74630","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"74630"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00074630","sets":["1"]},"author_link":["873242","873238","873239","873244","873240","873245","873241","873243"],"item_8_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2019-02","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"022002","bibliographicPageEnd":"22","bibliographicPageStart":"1","bibliographicVolumeNumber":"22","bibliographic_titles":[{"bibliographic_title":"Physical Review Accelerators and Beams"}]}]},"item_8_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"電界放出は、超伝導空洞の性能悪化で最も深刻な問題の1つである。しかし、空洞性能試験と低温モジュール運転では、電界放出源を特定することは困難である。そこで電界放出源から電子放出を正確に調べるための診断システムを開発した。開発されたシステムは、カーボン・センサーとSiピン（PIN）ダイオードの2種類のセンサーで構成され、電子放出によってもたらされる温度上昇と放射線を測定する。空洞軸のまわりでセンサー配列を回転させることにより空洞面に関する詳細な情報を得ることができ、発生源の識別が可能になった。またシミュレーションから電界放出源がどのように確認されるかについても述べる。","subitem_description_type":"Abstract"}]},"item_8_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"American Physics Society"}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1103/PhysRevAccelBeams.22.022002","subitem_relation_type_select":"DOI"}}]},"item_8_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://journals.aps.org/prab/abstract/10.1103/PhysRevAccelBeams.22.022002","subitem_relation_type_select":"URI"}}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"阪井寛志"}],"nameIdentifiers":[{"nameIdentifier":"873238","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Cenni , Enrico"}],"nameIdentifiers":[{"nameIdentifier":"873239","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"江並和宏"}],"nameIdentifiers":[{"nameIdentifier":"873240","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"古屋貴章"}],"nameIdentifiers":[{"nameIdentifier":"873241","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"沢村, 勝"}],"nameIdentifiers":[{"nameIdentifier":"873242","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"篠江憲治"}],"nameIdentifiers":[{"nameIdentifier":"873243","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"梅森健成"}],"nameIdentifiers":[{"nameIdentifier":"873244","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sawamura, Masaru","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"873245","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Field emission studies in vertical test and during cryomodule operation using precise x-ray mapping system","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Field emission studies in vertical test and during cryomodule operation using precise x-ray mapping system"}]},"item_type_id":"8","owner":"1","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2019-02-05"},"publish_date":"2019-02-05","publish_status":"0","recid":"74630","relation_version_is_last":true,"title":["Field emission studies in vertical test and during cryomodule operation using precise x-ray mapping system"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T21:49:44.188726+00:00"}