{"created":"2023-05-15T14:53:43.811056+00:00","id":73167,"links":{},"metadata":{"_buckets":{"deposit":"e4ce79e2-d54d-42bb-9ecc-3687ab37f5de"},"_deposit":{"created_by":1,"id":"73167","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"73167"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00073167","sets":["10:28"]},"author_link":["807793","807796","807790","807788","807787","807791","807792","807795","807794","807789"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2018-12-04","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"ITERやJT-60SA等の次期核融合装置では、低規格化衝突度領域での運転が想定されておりこれらの領域のペデスタル構造の理解が必要であるので、JT-60Uでの低規格化衝突度領域で電子密度と電子温度分布の構造を調べた。ガスパフの量を変化させた規格化衝突度が0.06と0.32の場合について調べた結果、高い規格化衝突度領域では、低い時に比べ電子密度と電子温度のペデスタル肩は約2%プラズマの外側に移動することが分かり、規格化衝突度領域の依存性が明らかになった。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第35回プラズマ・核融合学会年会","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"東條, 寛"}],"nameIdentifiers":[{"nameIdentifier":"807787","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"浦野, 創"}],"nameIdentifiers":[{"nameIdentifier":"807788","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"仲野, 友英"}],"nameIdentifiers":[{"nameIdentifier":"807789","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"相羽, 信行"}],"nameIdentifiers":[{"nameIdentifier":"807790","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"大山, 直幸"}],"nameIdentifiers":[{"nameIdentifier":"807791","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tojo, Hiroshi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"807792","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Urano, Hajime","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"807793","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Nakano, Tomohide","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"807794","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Aiba, Nobuyuki","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"807795","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Oyama, Naoyuki","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"807796","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"JT-60Uプラズマ周辺部ペデスタルの電子密度分布構造の規格化衝突度依存性","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"JT-60Uプラズマ周辺部ペデスタルの電子密度分布構造の規格化衝突度依存性"}]},"item_type_id":"10005","owner":"1","path":["28"],"pubdate":{"attribute_name":"公開日","attribute_value":"2019-01-28"},"publish_date":"2019-01-28","publish_status":"0","recid":"73167","relation_version_is_last":true,"title":["JT-60Uプラズマ周辺部ペデスタルの電子密度分布構造の規格化衝突度依存性"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T23:38:12.733563+00:00"}