{"created":"2023-05-15T14:53:40.130681+00:00","id":73087,"links":{},"metadata":{"_buckets":{"deposit":"10d40c69-4e5f-4b32-8c5a-ca49f72a60f5"},"_deposit":{"created_by":1,"id":"73087","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"73087"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00073087","sets":["10:28"]},"author_link":["927716","927721","927726","927728","927720","927718","927722","927717","927723","927719","927725","927714","927729","927715","927727","927724"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2018-12-05","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"QSTでは40MeVの重陽子と液体リチウムとの反応による先進核融合中性子源（A-FNS）の設計を行っている。A-FNSの試験セルに設置し、中性子照射試験を行う試験モジュールの基本概念検討を行った。A-FNSで用いる試験モジュールとして、中性子計測モジュール、構造材料微小機械試験片照射モジュール、トリチウム放出特性試験照射モジュール、放射化腐食生成物試験片照射モジュール、構造材料クリープ試験照射モジュール、ブランケット機能材料照射モジュール、ブランケット核特性試験モジュール、計測制御機器照射モジュール、多目的利用用のRI生成モジュールを選定した。本学会にて、これらのモジュールの目的、基本要求性能、試験セル内のモジュールの設置位置や照射計画等を発表する。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第35回プラズマ・核融合学会年会","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"佐藤, 聡"}],"nameIdentifiers":[{"nameIdentifier":"927714","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"朴, 昶虎"}],"nameIdentifiers":[{"nameIdentifier":"927715","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"権, セロム"}],"nameIdentifiers":[{"nameIdentifier":"927716","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"太田, 雅之"}],"nameIdentifiers":[{"nameIdentifier":"927717","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"中村, 誠"}],"nameIdentifiers":[{"nameIdentifier":"927718","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"手塚, 勝"}],"nameIdentifiers":[{"nameIdentifier":"927719","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"落合, 謙太郎"}],"nameIdentifiers":[{"nameIdentifier":"927720","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"春日井, 敦"}],"nameIdentifiers":[{"nameIdentifier":"927721","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Satoshi, Sato","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"927722","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Park, ChangHo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"927723","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Gon, Seromu","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"927724","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Masayuki, Ota","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"927725","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Makoto, Nakamura","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"927726","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Masaru, Teduka","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"927727","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kentaro, Ochiai","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"927728","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Atsushi, Kasugai","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"927729","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"A-FNS用試験モジュールの基本概念検討","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"A-FNS用試験モジュールの基本概念検討"}]},"item_type_id":"10005","owner":"1","path":["28"],"pubdate":{"attribute_name":"公開日","attribute_value":"2018-12-13"},"publish_date":"2018-12-13","publish_status":"0","recid":"73087","relation_version_is_last":true,"title":["A-FNS用試験モジュールの基本概念検討"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:43:04.377153+00:00"}