{"created":"2023-05-15T14:53:32.445834+00:00","id":72911,"links":{},"metadata":{"_buckets":{"deposit":"a7d59ea5-d0f7-4fdc-8d34-6d76376b66e1"},"_deposit":{"created_by":1,"id":"72911","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"72911"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00072911","sets":["10:28"]},"author_link":["718432","718438","718440","718434","718431","718436","718433","718435","718439","718430","718437"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2018-07-05","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"　ポリメチルメタクリレート(PMMA)標的にサブMeV級のC60イオンを照射した際の二次負イオン放出特性を分析した結果を報告する。C60イオンパルスビームと飛行時間測定二次イオン質量分析法にイベント毎の測定モードを組み合わせることにより、C60イオン1個によって放出される二次負イオン数の確率分布及び特定の二次負イオン種について相対収量のエネルギー依存性を測定した。これらの分析により明らかになった二次負イオンの放出特性は、サブMeV級C60イオンによって標的中に形成されるイオントラックの構造(直径、長さ)によって説明できることがわかった。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"10th International Symposium on Swift Heavy Ions in Matter & 28th International Conference on Atomic Collisions in Solids","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"平田, 浩一 (産総研)"}],"nameIdentifiers":[{"nameIdentifier":"718430","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"山田, 圭介"}],"nameIdentifiers":[{"nameIdentifier":"718431","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"千葉, 敦也"}],"nameIdentifiers":[{"nameIdentifier":"718432","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"平野, 貴美"}],"nameIdentifiers":[{"nameIdentifier":"718433","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"鳴海, 一雅"}],"nameIdentifiers":[{"nameIdentifier":"718434","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"齋藤, 勇一"}],"nameIdentifiers":[{"nameIdentifier":"718435","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"山田 圭介","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"718436","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"千葉 敦也","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"718437","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"平野 貴美","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"718438","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"鳴海 一雅","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"718439","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"齋藤 勇一","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"718440","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"Highly-sensitive time-of-flight secondary ion mass spectrometry with high energy cluster ion beams","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Highly-sensitive time-of-flight secondary ion mass spectrometry with high energy cluster ion beams"}]},"item_type_id":"10005","owner":"1","path":["28"],"pubdate":{"attribute_name":"公開日","attribute_value":"2018-08-30"},"publish_date":"2018-08-30","publish_status":"0","recid":"72911","relation_version_is_last":true,"title":["Highly-sensitive time-of-flight secondary ion mass spectrometry with high energy cluster ion beams"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T19:34:45.656250+00:00"}