{"created":"2023-05-15T14:53:29.684199+00:00","id":72848,"links":{},"metadata":{"_buckets":{"deposit":"aa922c6a-bb3d-489c-bf10-bdf1da747db2"},"_deposit":{"created_by":1,"id":"72848","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"72848"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00072848","sets":["10:28"]},"author_link":["717696","717685","717689","717686","717692","717688","717690","717693","717695","717694","717691","717687"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2018-06-29","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"ブランケット構造材料として開発された低放射化フェライト鋼の使用温度の低温側は573 K近傍であり、ここでは数dpa程度の中性子照射損傷量にて著しく照射硬化・脆化することがわかっており、照射後引張試験における正確なひずみ計測はブランケット設計活動において重要である。照射後引張試験は微小試験片を利用するため一般的なひずみ計を利用することはできない。そこでこれまではクロスヘッドの変位から計算される公称ひずみが代替されてきたが、これは試験片の標点間の変形以外の影響、例えば、肩部、冶具、そして、試験機一部の変形などを含んでいた。そこでは本研究はビデオカメラを用いて試験片の標点間部の画像を撮影してより正確にひずみを計測することができる技術の開発を目的とした。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第12回核融合エネルギー連合講演会","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"酒瀬川, 英雄"}],"nameIdentifiers":[{"nameIdentifier":"717685","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"加藤, 太一朗"}],"nameIdentifiers":[{"nameIdentifier":"717686","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"安堂, 正己"}],"nameIdentifiers":[{"nameIdentifier":"717687","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"谷川, 博康"}],"nameIdentifiers":[{"nameIdentifier":"717688","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Chen, X."}],"nameIdentifiers":[{"nameIdentifier":"717689","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Linares, A.E."}],"nameIdentifiers":[{"nameIdentifier":"717690","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Geringer, J.W."}],"nameIdentifiers":[{"nameIdentifier":"717691","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Katoh, Y."}],"nameIdentifiers":[{"nameIdentifier":"717692","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"酒瀬川 英雄","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"717693","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"加藤 太一朗","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"717694","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"安堂 正己","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"717695","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"谷川 博康","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"717696","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"中性子重照射後引張試験のための画像ひずみ計測技術の開発","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"中性子重照射後引張試験のための画像ひずみ計測技術の開発"}]},"item_type_id":"10005","owner":"1","path":["28"],"pubdate":{"attribute_name":"公開日","attribute_value":"2018-07-03"},"publish_date":"2018-07-03","publish_status":"0","recid":"72848","relation_version_is_last":true,"title":["中性子重照射後引張試験のための画像ひずみ計測技術の開発"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T19:35:22.988379+00:00"}