{"created":"2023-05-15T14:53:03.871961+00:00","id":72377,"links":{},"metadata":{"_buckets":{"deposit":"9aaa4e49-2036-471e-892b-7fa3d14b0a9d"},"_deposit":{"created_by":1,"id":"72377","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"72377"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00072377","sets":["10:28"]},"author_link":["712930","712927","712929","712928","712932","712931"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2017-06-26","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Radiation degradation characterization method for solar cells embedded with quantum dot (QD) layers using Photo-Induced Current Transient Spectroscopy (PICTS) is proposed in this study. Contrary to Deep Level Transient Spectroscopy (DLTS), PICTS is capable of comparing directly photo-current degradation to radiation induced defects for p-i-n structure solar cells, which is a basic structure of QD solar cells. GaAs p-i-n solar cells with 50 In0.4Ga0.6As QD layers are fabricated by Molecular Beam Epitaxy (MBE) and the radiation degradation is investigated by PICTS measurement. The current-voltage characteristics under AM0, 1 sun condition is also investigated and the degradation of solar cell performance is discussed by comparison to defect levels obtained from PICTS spectra. GaAs p-i-n solar cells without QDs are also investigated for comparison.","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第44回光起電力専門家会議(PVSC44)","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"佐藤, 真一郎"}],"nameIdentifiers":[{"nameIdentifier":"712927","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sugaya, Takeyoshi"}],"nameIdentifiers":[{"nameIdentifier":"712928","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Nakamura, Tetsuya"}],"nameIdentifiers":[{"nameIdentifier":"712929","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ohshima, Takeshi"}],"nameIdentifiers":[{"nameIdentifier":"712930","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"佐藤 真一郎","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"712931","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"大島 武","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"712932","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"Defect Characterization of III-V Quantum Structure Solar Cells Using Photo-Induced Current Transient Spectroscopy","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Defect Characterization of III-V Quantum Structure Solar Cells Using Photo-Induced Current Transient Spectroscopy"}]},"item_type_id":"10005","owner":"1","path":["28"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-07-04"},"publish_date":"2017-07-04","publish_status":"0","recid":"72377","relation_version_is_last":true,"title":["Defect Characterization of III-V Quantum Structure Solar Cells Using Photo-Induced Current Transient Spectroscopy"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T19:40:31.187267+00:00"}