{"created":"2023-05-15T14:52:53.836595+00:00","id":72222,"links":{},"metadata":{"_buckets":{"deposit":"1c87bafd-2d3a-49cf-b58b-82323ae99927"},"_deposit":{"created_by":1,"id":"72222","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"72222"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00072222","sets":["10:28"]},"author_link":["711311","711318","711314","711319","711321","711320","711310","711317","711308","711315","711309","711307","711316","711312","711313"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2016-05-24","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We have improved a soft x-ray laser interferometer synchronized with a Ti:Sapphire laser pulse to observe the single-shot image of the nano-scaled structure dynamics of the laser induced materials.  By using this system, we have succeeded in the observation of the thin film structures above the solid (or liquid) surface in the femto-second laser ablation process of metals (Au).","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"The 15th International Conference on X-Ray Lasers","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"長谷川, 登"}],"nameIdentifiers":[{"nameIdentifier":"711307","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"錦野"}],"nameIdentifiers":[{"nameIdentifier":"711308","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"石野, 雅彦"}],"nameIdentifiers":[{"nameIdentifier":"711309","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"大西直史"}],"nameIdentifiers":[{"nameIdentifier":"711310","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"伊藤篤史"}],"nameIdentifiers":[{"nameIdentifier":"711311","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"南康夫"}],"nameIdentifiers":[{"nameIdentifier":"711312","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"馬場基芳"}],"nameIdentifiers":[{"nameIdentifier":"711313","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Faenov, A.Y."}],"nameIdentifiers":[{"nameIdentifier":"711314","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Inogamov, N."}],"nameIdentifiers":[{"nameIdentifier":"711315","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"河内, 哲哉"}],"nameIdentifiers":[{"nameIdentifier":"711316","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"末元徹"}],"nameIdentifiers":[{"nameIdentifier":"711317","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"長谷川 登","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"711318","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"錦野 将元","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"711319","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"石野 雅彦","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"711320","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"河内 哲哉","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"711321","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"The observation of transient thin film structures during the femto-second laser ablation process by using the soft x-ray laser probe","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"The observation of transient thin film structures during the femto-second laser ablation process by using the soft x-ray laser probe"}]},"item_type_id":"10005","owner":"1","path":["28"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-03-21"},"publish_date":"2017-03-21","publish_status":"0","recid":"72222","relation_version_is_last":true,"title":["The observation of transient thin film structures during the femto-second laser ablation process by using the soft x-ray laser probe"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T19:42:22.564561+00:00"}