{"created":"2023-05-15T14:50:21.372970+00:00","id":68864,"links":{},"metadata":{"_buckets":{"deposit":"fd5fe84e-70ff-4fab-9f25-ded4c5018ca9"},"_deposit":{"created_by":1,"id":"68864","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"68864"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00068864","sets":["10:28"]},"author_link":["675865","675871","675870","675867","675875","675872","675873","675876","675866","675868","675874","675869"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2007-03-02","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"PIXE分析法は、加速されたイオンビームを試料に照射し、放出される特性X線のエネルギーを測定して元素分析を行う方法である。この方法は、少ない試料でも繰り返し測定できる、定量可能な多元素同時分析法ということから、近年、加速器を持つ様々な研究・教育機関でエアロゾルなど、環境試料の解析を目的として開発、利用されるようになってきた。しかしながら、定量のためには、イオンビーム照射量を正確に知ることが重要であるが、真空中に試料をおくコンベンショナルなPIXE分析法では、試料によって厚みや状態が異なるので、ターゲットとなる試料の電流積算値が照射量に比例するとは限らない。放射線医学総合研究所ではPIXE分析において試料の状態に依らず、照射量を正確に制御できる装置の開発を行った。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"平成18年度名古屋大学総合技術研究会","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"石川, 剛弘"}],"nameIdentifiers":[{"nameIdentifier":"675865","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"磯, 浩之"}],"nameIdentifiers":[{"nameIdentifier":"675866","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小西, 輝昭"}],"nameIdentifiers":[{"nameIdentifier":"675867","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"北村, 尚"}],"nameIdentifiers":[{"nameIdentifier":"675868","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"濱野, 毅"}],"nameIdentifiers":[{"nameIdentifier":"675869","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"今関, 等"}],"nameIdentifiers":[{"nameIdentifier":"675870","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"石川 剛弘","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"675871","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"磯 浩之","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"675872","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小西 輝昭","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"675873","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"北村 尚","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"675874","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"濱野 毅","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"675875","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"今関 等","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"675876","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"PIXE分析法におけるビーム電流リアルタイム測定システムの開発","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"PIXE分析法におけるビーム電流リアルタイム測定システムの開発"}]},"item_type_id":"10005","owner":"1","path":["28"],"pubdate":{"attribute_name":"公開日","attribute_value":"2007-03-05"},"publish_date":"2007-03-05","publish_status":"0","recid":"68864","relation_version_is_last":true,"title":["PIXE分析法におけるビーム電流リアルタイム測定システムの開発"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:21:12.997417+00:00"}