{"created":"2023-05-15T14:49:46.433110+00:00","id":68147,"links":{},"metadata":{"_buckets":{"deposit":"05ddac9c-4cef-4cb9-aa7f-b1bf8cfacddb"},"_deposit":{"created_by":1,"id":"68147","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"68147"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00068147","sets":["10:28"]},"author_link":["669084","669080","669085","669081","669079","669078","669082","669086","669083"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2005-08-10","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The EUSO telescope will be irradiated with space radiation for 5 years while on a low earth orbit. Many parts of the telescope are of a new design and have no data regarding radiation damage. In order to investigate the effects of radiation damage to the electric parts while in a low earth orbit, photodetector modules (PDM) and glass windows for the Multi-Anode Photo-Multiplier Tubes (MAPMT) in the telescope were irradiated with medium energy (70 MeV) proton beams from an accelerator at the National Institute of Radiological Sciences (NIRS) in Japan. Based on these results, the capability of these parts when exposed to an actual space radiation environment after 5 years can be estimated.","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"29th International Cosmic Ray Conference","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Uchihori, Yukio"}],"nameIdentifiers":[{"nameIdentifier":"669078","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kitamura, Hisashi"}],"nameIdentifiers":[{"nameIdentifier":"669079","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Fujitaka, Kazunobu"}],"nameIdentifiers":[{"nameIdentifier":"669080","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yasuda, Nakahiro"}],"nameIdentifiers":[{"nameIdentifier":"669081","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Benton, Eric"}],"nameIdentifiers":[{"nameIdentifier":"669082","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"内堀 幸夫","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"669083","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"北村 尚","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"669084","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"藤高 和信","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"669085","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"安田 仲宏","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"669086","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"Radiation test for electric parts of EUSO Photo Detector Module","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Radiation test for electric parts of EUSO Photo Detector Module"}]},"item_type_id":"10005","owner":"1","path":["28"],"pubdate":{"attribute_name":"公開日","attribute_value":"2005-08-12"},"publish_date":"2005-08-12","publish_status":"0","recid":"68147","relation_version_is_last":true,"title":["Radiation test for electric parts of EUSO Photo Detector Module"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:29:33.613530+00:00"}