{"created":"2023-05-15T14:49:34.876737+00:00","id":67889,"links":{},"metadata":{"_buckets":{"deposit":"4edd4ac1-3298-4323-b5a8-bb6f1b7a28fb"},"_deposit":{"created_by":1,"id":"67889","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"67889"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00067889","sets":["10:28"]},"author_link":["666873","666874"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2004-09-24","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In the cancer therapy using ion beam, scanning irradiation method has been developed in order to realize 3-D conformal irradiation. From the studies of scanning method, it has been required for a medical synchrotron to be capable of controlling the beam intensity during a single flattop for the purpose. The beam intensity control technique with the RF-knockout slow-extraction has been studied and developed at the HIMAC synchrotron. Based on the analytical approach, the beam intensity can be controlled by modulating dynamically the amplitude of the transverse RF-field. The dynamic range of the intensity control is one order during a single flattop. We report the simulation and the experiment result of the intensity control for the scanning irradiation.","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"8th European Conference on Accelerators in Applied Research and Technology","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"古川, 卓司"}],"nameIdentifiers":[{"nameIdentifier":"666873","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"古川 卓司","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"666874","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"スキャニング照射法のためのRF-knockout取り出し法による強度変調","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"スキャニング照射法のためのRF-knockout取り出し法による強度変調"}]},"item_type_id":"10005","owner":"1","path":["28"],"pubdate":{"attribute_name":"公開日","attribute_value":"2004-09-28"},"publish_date":"2004-09-28","publish_status":"0","recid":"67889","relation_version_is_last":true,"title":["スキャニング照射法のためのRF-knockout取り出し法による強度変調"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:32:33.606618+00:00"}