{"created":"2023-05-15T14:49:12.730829+00:00","id":67401,"links":{},"metadata":{"_buckets":{"deposit":"d1eaaeeb-35fd-44ff-b74b-5c18d51e7c27"},"_deposit":{"created_by":1,"id":"67401","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"67401"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00067401","sets":["10:28"]},"author_link":["662519","662520"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2003-03-14","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The scanning microbeam PIXE (Particle Induced X-ray Emission) analysis\nallows identifying the several surface elements and taking the\nhigh-resolution elemental maps of the specimen at a time, by using the\nnarrow beam downed the size to 1 micrometer and the maximum scanning area of\n2mm square.\nWe are applying this system to the elements and the structure analysis for\nbio-cells and environmental specimens.\nThe most important procedure to obtain the high-resolution maps is\nincreasing spatial resolution of the microbeam.\nWe diagnose the resolution by using Scanning Transmission Ion Microscopy\n(STIM) and PIXE images of the 12.5um pitch copper mesh.\nIn this workshop, we introduce our experiences of the alignment of the\nmicrobeam system.","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"Workshop on Accelerator Operation(WAO) 2003","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Imaseki, Hitoshi"}],"nameIdentifiers":[{"nameIdentifier":"662519","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"今関 等","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"662520","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"Beam alignment of scanning microbeam PIXE analysis system in NIRS","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Beam alignment of scanning microbeam PIXE analysis system in NIRS"}]},"item_type_id":"10005","owner":"1","path":["28"],"pubdate":{"attribute_name":"公開日","attribute_value":"2003-07-02"},"publish_date":"2003-07-02","publish_status":"0","recid":"67401","relation_version_is_last":true,"title":["Beam alignment of scanning microbeam PIXE analysis system in NIRS"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:38:10.519656+00:00"}