{"created":"2023-05-15T14:49:11.087891+00:00","id":67366,"links":{},"metadata":{"_buckets":{"deposit":"e8035644-4c6d-4484-99de-9fa47cd56b7d"},"_deposit":{"created_by":1,"id":"67366","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"67366"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00067366","sets":["10:28"]},"author_link":["662245","662252","662253","662243","662247","662250","662244","662251","662248","662242","662249","662246","662241"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2003-04-08","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We have been measured the recoil particles due to the proton irradiation in target material. CR-39 detectors were exposed in water column. CR-39 has no sensitivity for the incident proton (160 MeV), so that we can detect only the product of proton reaction in water and CR-39 itself. We have obtained the LET distribution at several depths in water. But it has the strong dependence of etching condition of CR-39. We will continue this work with AFM in order to reduce the ambiguity that caused by traditional optical microscopy.","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"H14年度HIMAC共同利用研究成果発表会","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"山本, 幹男"}],"nameIdentifiers":[{"nameIdentifier":"662241","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"安田, 仲宏"}],"nameIdentifiers":[{"nameIdentifier":"662242","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"蔵野, 美恵子"}],"nameIdentifiers":[{"nameIdentifier":"662243","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"松藤, 成弘"}],"nameIdentifiers":[{"nameIdentifier":"662244","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"宮原, 信幸"}],"nameIdentifiers":[{"nameIdentifier":"662245","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"西尾, 禎治"}],"nameIdentifiers":[{"nameIdentifier":"662246","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小倉, 紘一"}],"nameIdentifiers":[{"nameIdentifier":"662247","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"山本 幹男","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"662248","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"安田 仲宏","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"662249","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"蔵野 美恵子","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"662250","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"松藤 成弘","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"662251","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"宮原 信幸","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"662252","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"西尾 禎治","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"662253","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"陽子線照射による短飛程フラグメントの計測","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"陽子線照射による短飛程フラグメントの計測"}]},"item_type_id":"10005","owner":"1","path":["28"],"pubdate":{"attribute_name":"公開日","attribute_value":"2003-04-24"},"publish_date":"2003-04-24","publish_status":"0","recid":"67366","relation_version_is_last":true,"title":["陽子線照射による短飛程フラグメントの計測"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:38:34.275005+00:00"}