{"created":"2023-05-15T14:49:06.968004+00:00","id":67276,"links":{},"metadata":{"_buckets":{"deposit":"4ad50530-c1e7-4608-92c1-4d20060cdba9"},"_deposit":{"created_by":1,"id":"67276","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"67276"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00067276","sets":["10:28"]},"author_link":["661411","661416","661413","661414","661415","661417","661418","661412"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2002-10-25","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":" Diallyl phthalate (DAP, C14H14O4), allyl diglycol carbonate (CR-39, C12H18O7) and mixtures of DAP and CR-39 were cast into resin plates under same polymerizing conditions. The plates were irradiated with several kinds of ion accelerator. After irradiation, the plates were etched with an aqueous solution of KOH. After etching, enlarged ion tracks (etch-pits) on the plates were observed using an optical microscope. The etch-pits daimeter increases linearly with the etching time. At any given etching time, as the concentration of DAP increases the etch-pits become smaller for any given kind of ions. The is a possibility of dscriminating positively between the kinds of the ions.","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第２１回　固体検出器国際会議","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Koguchi, Yasuhiro"}],"nameIdentifiers":[{"nameIdentifier":"661411","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tsuruta, Takao"}],"nameIdentifiers":[{"nameIdentifier":"661412","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yasuda, Nakahiro"}],"nameIdentifiers":[{"nameIdentifier":"661413","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yamamoto, Mikio"}],"nameIdentifiers":[{"nameIdentifier":"661414","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小口 靖弘","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"661415","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"鶴田 隆雄","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"661416","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"安田 仲宏","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"661417","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"山本 幹男","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"661418","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"Nuclear track detector with controllable sensitivity using DAP, CR-39 and its copolymers","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Nuclear track detector with controllable sensitivity using DAP, CR-39 and its copolymers"}]},"item_type_id":"10005","owner":"1","path":["28"],"pubdate":{"attribute_name":"公開日","attribute_value":"2002-10-25"},"publish_date":"2002-10-25","publish_status":"0","recid":"67276","relation_version_is_last":true,"title":["Nuclear track detector with controllable sensitivity using DAP, CR-39 and its copolymers"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:39:37.635511+00:00"}