{"created":"2023-05-15T14:48:53.122824+00:00","id":66964,"links":{},"metadata":{"_buckets":{"deposit":"2a4e8374-d71a-4ce6-b162-16ad0928e887"},"_deposit":{"created_by":1,"id":"66964","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"66964"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00066964","sets":["10:29"]},"author_link":["658180","658189","658188","658183","658186","658187","658185","658182","658184","658181"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2018-10-24","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Effects of high irradiation dose on a Nd:YAG/Cr:YAG microchip composite and the giant-pulse microchip laser operation using the composite were investigated. Although emission from the composite during the irradiation was observed which increased with the dose rate, laser operation applicable to remote laser-induced breakdown spectroscopy (LIBS) was possible. The results show that the LIBS system using the microchip laser is promising for the applications at the severe radiation environment such as the inspection of the fuel debris at the Fukushima Daiich nuclear power plant","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"SCIX2018/LIBS2018","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"田村, 浩司"}],"nameIdentifiers":[{"nameIdentifier":"658180","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"大場, 弘則"}],"nameIdentifiers":[{"nameIdentifier":"658181","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"佐伯, 盛久"}],"nameIdentifiers":[{"nameIdentifier":"658182","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"田口, 富嗣"}],"nameIdentifiers":[{"nameIdentifier":"658183","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hong, LIM Hwan"}],"nameIdentifiers":[{"nameIdentifier":"658184","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"平等拓範"}],"nameIdentifiers":[{"nameIdentifier":"658185","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"田村 浩司","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"658186","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"大場 弘則","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"658187","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"佐伯 盛久","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"658188","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"田口 富嗣","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"658189","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"Microchip-Laser Induced Breakdown Spectroscopy for Remote Analysis of Severe Accident Reactor: Measurements of Radiation Dose Rate Effects","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Microchip-Laser Induced Breakdown Spectroscopy for Remote Analysis of Severe Accident Reactor: Measurements of Radiation Dose Rate Effects"}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2018-11-07"},"publish_date":"2018-11-07","publish_status":"0","recid":"66964","relation_version_is_last":true,"title":["Microchip-Laser Induced Breakdown Spectroscopy for Remote Analysis of Severe Accident Reactor: Measurements of Radiation Dose Rate Effects"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:43:00.069763+00:00"}