{"created":"2023-05-15T14:48:40.357285+00:00","id":66679,"links":{},"metadata":{"_buckets":{"deposit":"c435989d-b48c-4f8b-8503-557cbe447faa"},"_deposit":{"created_by":1,"id":"66679","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"66679"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00066679","sets":["10:29"]},"author_link":["655714","655720","655721","655713","655722","655723","655716","655719","655712","655710","655718","655715","655717","655711","655709"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2018-03-22","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"　高速C_60イオンを用いた透過型二次イオン質量分析法(SIMS)において分析対象となる生体分子に対する損傷の定量的評価を行った。SiN薄膜(厚さ30 nm)の片面に真空蒸着法でフェニルアラニン(C_9H_11NO_2、分子量165.19)を約70 nm堆積した薄膜試料に、6 MeVのC_60^+イオンをSiN側から入射角45°で照射して、出射側の表面から前方に放出される正の二次イオンの質量スペクトルの積算照射量に対する変化を観察した。照射量の増加とともに無傷のフェニルアラニン分子イオン(プロトン付加分子、m/z=166)が減少し、逆に低質量のフラグメントイオンが増加した。この結果から無傷のフェニルアラニン分子の消失断面積が2.5×10^-12 cm^2と求められた。また、同じ照射条件でフェニルアラニンのスパッタリング収量も測定し、3.0×10^4 分子/C_60 ion（入射角 45°）の値を得た。講演では、同様の試料をフェニルアラニン側から照射した場合の結果と比較して、高速C_60イオンを用いた透過型SIMSの有効性について考察する。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"日本物理学会第73回年次大会","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"石井, 洋晶 (京大)"}],"nameIdentifiers":[{"nameIdentifier":"655709","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"澤田, 純平 (京大)"}],"nameIdentifiers":[{"nameIdentifier":"655710","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"中嶋, 薫 (京大)"}],"nameIdentifiers":[{"nameIdentifier":"655711","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"木村, 健二 (京大)"}],"nameIdentifiers":[{"nameIdentifier":"655712","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"千葉, 敦也"}],"nameIdentifiers":[{"nameIdentifier":"655713","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"山田, 圭介"}],"nameIdentifiers":[{"nameIdentifier":"655714","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"平野, 貴美"}],"nameIdentifiers":[{"nameIdentifier":"655715","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"鳴海, 一雅"}],"nameIdentifiers":[{"nameIdentifier":"655716","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"齋藤, 勇一"}],"nameIdentifiers":[{"nameIdentifier":"655717","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"平田, 浩一 (産総研)"}],"nameIdentifiers":[{"nameIdentifier":"655718","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"千葉 敦也","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"655719","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"山田 圭介","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"655720","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"平野 貴美","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"655721","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"鳴海 一雅","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"655722","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"齋藤 勇一","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"655723","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"6 MeV C60+ イオンを用いた透過型 SIMS におけるアミノ酸分子の照射損傷","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"6 MeV C60+ イオンを用いた透過型 SIMS におけるアミノ酸分子の照射損傷"}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2018-03-22"},"publish_date":"2018-03-22","publish_status":"0","recid":"66679","relation_version_is_last":true,"title":["6 MeV C60+ イオンを用いた透過型 SIMS におけるアミノ酸分子の照射損傷"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:46:13.882505+00:00"}