{"created":"2023-05-15T14:48:26.345950+00:00","id":66367,"links":{},"metadata":{"_buckets":{"deposit":"25edc65d-96f3-463c-bb78-e5dde57f08eb"},"_deposit":{"created_by":1,"id":"66367","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"66367"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00066367","sets":["10:29"]},"author_link":["652995","652993","652991","652994","652997","652996","652990","652992"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2017-07-06","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"100eV程度のスピン偏極陽電子を物質表面に打ち込むと、表面電子とポジトロニウム(Ps)を形成して消滅し、この三光子消滅率から最表面の電子スピン偏極状態を評価することができる。我々は、表面Psの消滅寿命測定(PsLS)およびPs飛行時間測定(PsTOF)から、より詳細な表面電子スピン状態の決定を目指している。両者は表面Psの時間測定を行うという点で共通点が多く、装置の大部分を共用可能であり、一体的に開発を進めている。\n独自開発したNa-22線源により陽電子を発生させ、これを試料に打ち込んだ時に放出される二次電子の検出時刻と、試料で消滅したときの消滅ガンマ線の検出時刻との時間差を計測してPsLS測定を行った。Psを多く生成するシリカエアロゲル試料を用いて、o-Ps消滅由来の142 nsの寿命成分を、シグナル/ノイズ比70000および時間分解能14 nsで観測することに成功し、PsLSおよびPsTOF測定に十分な性能を有することを確認した。現在、TOF検出器の構築および信号処理系の整備を進めている。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"日本アイソトープ協会第54回アイソトープ・放射線研究発表会","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"前川, 雅樹"}],"nameIdentifiers":[{"nameIdentifier":"652990","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"和田, 健"}],"nameIdentifiers":[{"nameIdentifier":"652991","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"宮下, 敦巳"}],"nameIdentifiers":[{"nameIdentifier":"652992","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"河裾, 厚男"}],"nameIdentifiers":[{"nameIdentifier":"652993","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"前川 雅樹","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"652994","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"和田 健","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"652995","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"宮下 敦巳","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"652996","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"河裾 厚男","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"652997","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"スピン偏極ポジトロニウム分光測定装置の開発 ","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"スピン偏極ポジトロニウム分光測定装置の開発 "}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-07-14"},"publish_date":"2017-07-14","publish_status":"0","recid":"66367","relation_version_is_last":true,"title":["スピン偏極ポジトロニウム分光測定装置の開発 "],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:49:45.418825+00:00"}