{"created":"2023-05-15T14:48:23.157490+00:00","id":66301,"links":{},"metadata":{"_buckets":{"deposit":"0c7bd959-6715-4744-92d7-70e7146492f5"},"_deposit":{"created_by":1,"id":"66301","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"66301"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00066301","sets":["10:29"]},"author_link":["652420","652421","652417","652412","652413","652416","652419","652422","652414","652418","652406","652405","652408","652411","652415","652409","652407","652410"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2017-04-21","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Laser wakefield acceleration (LWFA)1 has been studied intensively due to the inherent ultrashort bunch duration (fs) and large acceleration gradient (GV/cm) over conventional accelerators. This regime is considered promising on construction of compact table-top X-ray free electron lasers (XFEL)2. The generation of XFEL relies on the process of self-amplification of spontaneous emission (SASE)3, which requires electron beam with extremely high current and low emittance to cause micro-bunching. During LWFA experiment, it is essential to establish electron temporal profile diagnostics as a reference to laser plasma parameter adjustment for generation of high peak current electron beams. \nWe present LWFA study via single-shot non-destructive electro-optic (EO) sampling4 technique for the first time. The electron spectra and divergence information had been detected simultaneously with electron bunch temporal signal. In the experiment, we observed earlier electron pulse arriving time with higher plasma density. At density above 3×1019cm-3, multi-bunch signal was frequently observed. PIC simulation has been performed to study the injection process. This diagnostic proved to have superior data attainability compared with previous works5-7 and could be introduced as a real time non-destructive electron pulse duration monitor for future LWFA experiment.\n\\nThis work was funded by ImPACT Program of Council for Science, Technology and Innovation (Cabinet Office, Government of Japan).","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"HEDS2017","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"ホァン, カイ"}],"nameIdentifiers":[{"nameIdentifier":"652405","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kotaki, Hideyuki"}],"nameIdentifiers":[{"nameIdentifier":"652406","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Mori, Michiaki"}],"nameIdentifiers":[{"nameIdentifier":"652407","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hayashi, Yukio"}],"nameIdentifiers":[{"nameIdentifier":"652408","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Nakanii, Nobuhiko"}],"nameIdentifiers":[{"nameIdentifier":"652409","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Timur, Esirkepov"}],"nameIdentifiers":[{"nameIdentifier":"652410","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kevin, Koga James"}],"nameIdentifiers":[{"nameIdentifier":"652411","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Bulanov, Sergey"}],"nameIdentifiers":[{"nameIdentifier":"652412","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kando, Masaki"}],"nameIdentifiers":[{"nameIdentifier":"652413","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"黄 開","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"652414","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小瀧 秀行","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"652415","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"森 道昭","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"652416","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"林 由紀雄","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"652417","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"中新 信彦","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"652418","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"エシロケポフ ティムル","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"652419","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"コーガ ジェームズ","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"652420","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"ブラノフ セルゲイ","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"652421","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"神門 正城","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"652422","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"Study of Laser Wakefield Acceleration via Single-shot Nondestructive Electro-optic Sampling Diagnostics","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Study of Laser Wakefield Acceleration via Single-shot Nondestructive Electro-optic Sampling Diagnostics"}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-04-26"},"publish_date":"2017-04-26","publish_status":"0","recid":"66301","relation_version_is_last":true,"title":["Study of Laser Wakefield Acceleration via Single-shot Nondestructive Electro-optic Sampling Diagnostics"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:50:29.037057+00:00"}