{"created":"2023-05-15T14:48:11.258640+00:00","id":66035,"links":{},"metadata":{"_buckets":{"deposit":"6dca0ce9-e829-401a-976f-f57559f93d33"},"_deposit":{"created_by":1,"id":"66035","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"66035"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00066035","sets":["10:29"]},"author_link":["650245","650247","650242","650238","650244","650237","650243","650241","650246","650239","650240","650236"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2016-11-25","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"MeV級水素イオンマイクロビームによる荷電粒子誘起発光(IBIL)顕微分光分析の開発では、光学系の改良によるS/N比の改善と複数の波長スペクトルの同時測定により、様々な試料からのIBILスペクトルの高感度かつ短時間の計測が可能になった。そこで、実際に環境試料中に含まれる化合物の分析にこれを利用した。実験では標準試料（SiO2:Feを含む）と環境試料のIBILスペクトルをそれぞれ測定し、前者から得られたIBILスペクトルについて、基線減算処理、ピークフィッティングを行った後、後者のIBILスペクトルと比較した。この結果、環境試料中に含まれている複数の化合物の中の一つのSiO2:Feの識別に成功した。今後、様々な化合物を含む標準試料のIBILスペクトルデータベースの整備を進めることにより、MeV級水素イオンマイクロビームを用いた化合物のマッピングが実現可能であることが示された。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第26回環境地質学シンンポジウム","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"加田, 渉"}],"nameIdentifiers":[{"nameIdentifier":"650236","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"川端, 駿介"}],"nameIdentifiers":[{"nameIdentifier":"650237","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"佐藤, 隆博"}],"nameIdentifiers":[{"nameIdentifier":"650238","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"江夏, 昌志"}],"nameIdentifiers":[{"nameIdentifier":"650239","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"山田, 尚人"}],"nameIdentifiers":[{"nameIdentifier":"650240","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"三浦, 健太"}],"nameIdentifiers":[{"nameIdentifier":"650241","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"神谷, 富裕"}],"nameIdentifiers":[{"nameIdentifier":"650242","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"村尾, 智"}],"nameIdentifiers":[{"nameIdentifier":"650243","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"花泉, 修"}],"nameIdentifiers":[{"nameIdentifier":"650244","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"佐藤 隆博","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"650245","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"山田 尚人","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"650246","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"神谷 富裕","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"650247","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"微粒子や鉱物微小領域評価のためのイオンマイクロビーム発光連続分析技術","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"微粒子や鉱物微小領域評価のためのイオンマイクロビーム発光連続分析技術"}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2016-12-01"},"publish_date":"2016-12-01","publish_status":"0","recid":"66035","relation_version_is_last":true,"title":["微粒子や鉱物微小領域評価のためのイオンマイクロビーム発光連続分析技術"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:53:28.579673+00:00"}