{"created":"2023-05-15T14:48:08.701489+00:00","id":65981,"links":{},"metadata":{"_buckets":{"deposit":"c2c774d7-baed-4177-9756-9290227b0217"},"_deposit":{"created_by":1,"id":"65981","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"65981"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00065981","sets":["10:29"]},"author_link":["649827","649834","649828","649833","649831","649832","649830","649829","649826"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2016-09-14","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"スピン偏極低速陽電子ビームを用いると、磁性薄膜表面の電子スピン偏極率を表面ポジトロニウム(Ps)の3光子消滅率変化から評価できる。これまで我々はオルソポジトロニウム(o-Ps)の3光子消滅ガンマ線のエネルギー分布からこの測定を行っていたが、より高精度な測定を行うため、o-Psの寿命測定(PsLS)を行い、142 nsのo-Ps消滅寿命成分の強度変化から表面電子スピンの偏極率を測定する装置を開発した。\n　本装置ではNa-22線源を用いて生成されたスピン偏極陽電子ビームを試料に打ち込み、発生する二次電子の検出時刻と消滅ガンマ線の検出時刻の差からPsLSスペクトルを取得する。シリカエアロゲルを用いた装置の性能評価では、o-Ps消滅由来の140nsの寿命成分を測定できた。金属試料を用いた場合には、50eV程度の極低エネルギー打ち込みで表面Ps消滅由来のシグナルを検出できた。今後は薄膜強磁性材料の表面Ps計測を行う予定である。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"日本物理学会 2016年秋季大会","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"前川, 雅樹"}],"nameIdentifiers":[{"nameIdentifier":"649826","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"前川雅樹"}],"nameIdentifiers":[{"nameIdentifier":"649827","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"和田, 健"}],"nameIdentifiers":[{"nameIdentifier":"649828","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"宮下, 敦巳"}],"nameIdentifiers":[{"nameIdentifier":"649829","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"河裾, 厚男"}],"nameIdentifiers":[{"nameIdentifier":"649830","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"前川 雅樹","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"649831","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"和田 健","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"649832","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"宮下 敦巳","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"649833","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"河裾 厚男","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"649834","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"スピン偏極陽電⼦ビームによる表⾯ポジトロニウム寿命測定","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"スピン偏極陽電⼦ビームによる表⾯ポジトロニウム寿命測定"}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2016-09-30"},"publish_date":"2016-09-30","publish_status":"0","recid":"65981","relation_version_is_last":true,"title":["スピン偏極陽電⼦ビームによる表⾯ポジトロニウム寿命測定"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:54:05.662769+00:00"}