{"created":"2023-05-15T14:48:06.873115+00:00","id":65940,"links":{},"metadata":{"_buckets":{"deposit":"46b99b67-47e1-4013-a102-6209af7148ab"},"_deposit":{"created_by":1,"id":"65940","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"65940"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00065940","sets":["10:29"]},"author_link":["649520","649522","649518","649523","649519","649521","649524","649517"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2016-08-09","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In-situ X-ray RSM measurements in the RF-MBE growth of GaInN films on GaN and InN templates were carried out in order to understand the strain relaxation mechanism of GaInN. The in-situ RSM measurements were performed using the MBE directly coupled to an X-ray diffractometer at the beamline of synchrotron radiation facility Spring-8. From the results of in-situ X-ray RSM measurements, the strain relaxation involving the relaxation in lattice constant and that in compositional pulling effect was clearly observed.","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"The 18th International Conference on Crystal Growth and Epitaxy (ICCGE-18)","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"T., Yamaguchi (工学院大）"}],"nameIdentifiers":[{"nameIdentifier":"649517","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"佐々木, 拓生"}],"nameIdentifiers":[{"nameIdentifier":"649518","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"高橋, 正光"}],"nameIdentifiers":[{"nameIdentifier":"649519","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"T., Honda（工学院大）"}],"nameIdentifiers":[{"nameIdentifier":"649520","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"T., Onuma（工学院大）"}],"nameIdentifiers":[{"nameIdentifier":"649521","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Y., Nanishi（立命館大）"}],"nameIdentifiers":[{"nameIdentifier":"649522","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"佐々木 拓生","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"649523","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"高橋 正光","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"649524","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"Strain Relaxation Analysis Using In-situ X-ray Reciprocal Space Mapping Measurements in RF-MBE Growth of GaInN ","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Strain Relaxation Analysis Using In-situ X-ray Reciprocal Space Mapping Measurements in RF-MBE Growth of GaInN "}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2016-08-16"},"publish_date":"2016-08-16","publish_status":"0","recid":"65940","relation_version_is_last":true,"title":["Strain Relaxation Analysis Using In-situ X-ray Reciprocal Space Mapping Measurements in RF-MBE Growth of GaInN "],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:54:36.354681+00:00"}