{"created":"2023-05-15T14:48:06.474852+00:00","id":65931,"links":{},"metadata":{"_buckets":{"deposit":"9dfa4b8f-5eaf-4829-b0d0-2d4669c8d15e"},"_deposit":{"created_by":1,"id":"65931","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"65931"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00065931","sets":["10:29"]},"author_link":["649445","649444","649452","649447","649449","649446","649451","649443","649450","649448"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2016-06-14","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"検出器として MCP+CMOSを搭載したSEM-SXES（軟X線発光分光）装置を用い微量ボロン（B）の検出実験を行った。試料はB,P,Cの平均組成が45、53、41 ppm(wt.%)の炭素鋼であり、5か所の様々な領域のスペクトルを観察した。測定条件は、加速電圧5kV、電流量170nA、積算時間5分であった。SEM観察からBの析出物を含むと判断された領域ではB-Kの信号が観測された。その反対に存在しないとされた領域では観察されなかった。また、析出物ごとにO-K（2次光）、C-K、N-K、B-K、S-Kの強度分布が異なることが分かった。強いB-Kピークと共にO-K、N-K強度が強く観測された領域ではB-N、B-Oの化合物の存在が示唆される。Ni表面に高密度のDLC(ダイヤモンドライクカーボン)薄膜を付加した新型高効率回折格子を用いてBの組成が10ppmの炭素鋼試料でのB検出に成功した。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"日本顕微鏡学会第72回学術講演会（JSM2016）","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"寺内正己"}],"nameIdentifiers":[{"nameIdentifier":"649443","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"高橋秀之"}],"nameIdentifiers":[{"nameIdentifier":"649444","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"高倉, 優"}],"nameIdentifiers":[{"nameIdentifier":"649445","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"村野孝訓"}],"nameIdentifiers":[{"nameIdentifier":"649446","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小池, 雅人"}],"nameIdentifiers":[{"nameIdentifier":"649447","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"今園, 孝志"}],"nameIdentifiers":[{"nameIdentifier":"649448","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"長野, 哲也"}],"nameIdentifiers":[{"nameIdentifier":"649449","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"笹井, 浩行"}],"nameIdentifiers":[{"nameIdentifier":"649450","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小池 雅人","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"649451","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"今園 孝志","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"649452","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"SEM-SXESによる微量ボロンの化学状態分析","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"SEM-SXESによる微量ボロンの化学状態分析"}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2016-07-28"},"publish_date":"2016-07-28","publish_status":"0","recid":"65931","relation_version_is_last":true,"title":["SEM-SXESによる微量ボロンの化学状態分析"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:54:41.718965+00:00"}