{"created":"2023-05-15T14:48:04.228633+00:00","id":65881,"links":{},"metadata":{"_buckets":{"deposit":"01c66fd1-d572-408e-b4b3-009065fe6a42"},"_deposit":{"created_by":1,"id":"65881","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"65881"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00065881","sets":["10:29"]},"author_link":["648990","648984","648982","648981","648986","648988","648989","648983","648992","648993","648994","648991","648985","648987"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2016-03-19","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"現在高分子トラック損傷構造について赤外顕微鏡を用いた分析が行われている。従来用いてきた赤外線分光器と比べると測定域が小さく顕微鏡下で任意に測定点を決めることが出来るため、高フルエンスを実現するためにビームを細くするような小さな範囲を測定するために利用されている。しかし、ビーム照射域を絞ると強度にばらつきが生じることが知られており、そのため正確な定量分析が阻まれる。そこで、赤外顕微鏡の機能の一つである任意に格子点数や測定面積を決めることが可能である顕微マッピング測定機能の活用を試みた。同機能を用いることによりビーム強度の分布を明らかにすると共に、照射前後の吸光度比より化学的損傷パラメータの算出が可能となる。さらに過去に得られた結果と比較することにより、顕微マッピング機能の有効性の確認を行うことが本研究の目的である。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第63回応用物理学会春季学術講演会","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"上田, 隆裕"}],"nameIdentifiers":[{"nameIdentifier":"648981","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"楠本, 多聞"}],"nameIdentifiers":[{"nameIdentifier":"648982","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小田, 啓二"}],"nameIdentifiers":[{"nameIdentifier":"648983","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"金崎, 真聡"}],"nameIdentifiers":[{"nameIdentifier":"648984","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"北村, 尚"}],"nameIdentifiers":[{"nameIdentifier":"648985","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小平, 聡"}],"nameIdentifiers":[{"nameIdentifier":"648986","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"山内, 知也"}],"nameIdentifiers":[{"nameIdentifier":"648987","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"上田 隆裕","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"648988","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"楠本 多聞","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"648989","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小田 啓二","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"648990","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"金崎 真聡","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"648991","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"北村 尚","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"648992","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小平 聡","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"648993","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"山内 知也","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"648994","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"顕微マッピング測定を用いた損傷構造の分析","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"顕微マッピング測定を用いた損傷構造の分析"}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2016-03-24"},"publish_date":"2016-03-24","publish_status":"0","recid":"65881","relation_version_is_last":true,"title":["顕微マッピング測定を用いた損傷構造の分析"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:55:12.709965+00:00"}