{"created":"2023-05-15T14:48:04.090133+00:00","id":65878,"links":{},"metadata":{"_buckets":{"deposit":"54bd7af6-6d50-4f8b-969d-fbb258d55950"},"_deposit":{"created_by":1,"id":"65878","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"65878"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00065878","sets":["10:29"]},"author_link":["648958","648955","648956","648962","648960","648957","648961","648959"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2016-03-15","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Lindhard-Scharff理論に従うような低速粒子は、電子的阻止能ESPと、核阻止能NSPの両方でエネルギーを失う。銀塩写真感光材料においてESP作用は高速粒子と同じく電子の励起を伴い表面潜像を作るが、NSP作用は粒子内部に結晶欠陥を生成し、潜像核は欠陥上に形成される.これはハロゲン化銀を溶解しながら現像する内部現像法で検出される。フェノサフラニンPSやテトラゾリウム化合物Tzなどの電子捕獲型減感剤を添加すると、励起電子が捕らえられて失活するので、ESP作用の感度は大きく低下する。一方、NSP作用の感度は電子の関与しない結晶欠陥の形成過程を経るため、これら減感剤の影響を受けにくい。従って現像法を使い分けると低速粒子のNSP作用のみ選択的に検出出来る．この手法の有効性を検証した。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第30回固体飛跡検出器研究会","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"久下, 謙一"}],"nameIdentifiers":[{"nameIdentifier":"648955","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"鈴木, 秀祐"}],"nameIdentifiers":[{"nameIdentifier":"648956","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"中, 竜大"}],"nameIdentifiers":[{"nameIdentifier":"648957","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小平, 聡"}],"nameIdentifiers":[{"nameIdentifier":"648958","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"久下 謙一","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"648959","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"鈴木 秀祐","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"648960","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"中 竜大","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"648961","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小平 聡","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"648962","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"銀塩写真感光材料と内部現像法を用いた低速粒子飛跡の選択的検出","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"銀塩写真感光材料と内部現像法を用いた低速粒子飛跡の選択的検出"}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2016-03-23"},"publish_date":"2016-03-23","publish_status":"0","recid":"65878","relation_version_is_last":true,"title":["銀塩写真感光材料と内部現像法を用いた低速粒子飛跡の選択的検出"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:55:14.835006+00:00"}