{"created":"2023-05-15T14:48:03.868277+00:00","id":65873,"links":{},"metadata":{"_buckets":{"deposit":"58443292-0249-4e6e-b91e-d44a21eb9fcf"},"_deposit":{"created_by":1,"id":"65873","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"65873"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00065873","sets":["10:29"]},"author_link":["648890","648895","648898","648899","648897","648896","648894","648902","648903","648893","648900","648892","648891","648901"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2016-03-14","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"ポリアリルジグリコールカーボネート（PADC）は最も感度の高いエッチング型の飛跡検出器として知られている。本研究では、PADCに28 MeVの電子線を照射し、種々の化学的損傷パラメータを評価した。エーテル基の相対吸光度は照射フルエンスに対して線形的に減少している一方で、カーボネートエステル基及びCH基のそれは1.6×1015 electrons/cm2以上の照射で減少し始めた。我々はこのフルエンスにおいてトラックの重なりが顕著になると考え、考察を進めた。詳細については発表に譲る。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第30回固体飛跡検出器研究会","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"楠本, 多聞"}],"nameIdentifiers":[{"nameIdentifier":"648890","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"森, 豊"}],"nameIdentifiers":[{"nameIdentifier":"648891","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"金崎, 真聡"}],"nameIdentifiers":[{"nameIdentifier":"648892","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小田, 啓二"}],"nameIdentifiers":[{"nameIdentifier":"648893","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小平, 聡"}],"nameIdentifiers":[{"nameIdentifier":"648894","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"誉田, 義英"}],"nameIdentifiers":[{"nameIdentifier":"648895","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"藤乗, 幸子"}],"nameIdentifiers":[{"nameIdentifier":"648896","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"山内, 知也"}],"nameIdentifiers":[{"nameIdentifier":"648897","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"楠本 多聞","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"648898","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"森 豊","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"648899","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"金崎 真聡","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"648900","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小田 啓二","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"648901","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小平 聡","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"648902","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"山内 知也","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"648903","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"PADC検出器中に形成される28 MeV電子線飛跡の構造分析","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"PADC検出器中に形成される28 MeV電子線飛跡の構造分析"}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2016-03-23"},"publish_date":"2016-03-23","publish_status":"0","recid":"65873","relation_version_is_last":true,"title":["PADC検出器中に形成される28 MeV電子線飛跡の構造分析"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:55:18.198939+00:00"}