{"created":"2023-05-15T14:48:01.241652+00:00","id":65814,"links":{},"metadata":{"_buckets":{"deposit":"45d79bd4-f47d-4cc9-9e00-bd05f7de3f0d"},"_deposit":{"created_by":1,"id":"65814","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"65814"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00065814","sets":["10:29"]},"author_link":["648307","648299","648303","648302","648305","648301","648300","648306","648308","648298","648304"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2015-09-14","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Total ionizing dose (TID) effects on carbon nanotube network transistors were\nexperimentally evaluated using 60Co gamma-ray irradiation up to 50 kGy(Si). The electrical characteristics of the devices after irradiation are reported for future space applications.","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"Conference on Radiation Effects on Components and Systems in Moscow","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Ishii, Satoshi"}],"nameIdentifiers":[{"nameIdentifier":"648298","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yabe, Daisuke"}],"nameIdentifiers":[{"nameIdentifier":"648299","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Enomoto, Shotaro"}],"nameIdentifiers":[{"nameIdentifier":"648300","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Koshio, Shigeki"}],"nameIdentifiers":[{"nameIdentifier":"648301","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Konishi, Teruaki"}],"nameIdentifiers":[{"nameIdentifier":"648302","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hamano, Tsuyoshi"}],"nameIdentifiers":[{"nameIdentifier":"648303","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hirao, Toshio"}],"nameIdentifiers":[{"nameIdentifier":"648304","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小塩 成基","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"648305","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小西 輝昭","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"648306","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"濱野 毅","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"648307","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"平尾 敏雄","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"648308","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"Total Ionizing Dose Effects in Carbon Nanotube Network Transistors","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Total Ionizing Dose Effects in Carbon Nanotube Network Transistors"}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-11-19"},"publish_date":"2015-11-19","publish_status":"0","recid":"65814","relation_version_is_last":true,"title":["Total Ionizing Dose Effects in Carbon Nanotube Network Transistors"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:55:57.611152+00:00"}