{"created":"2023-05-15T14:47:54.382677+00:00","id":65659,"links":{},"metadata":{"_buckets":{"deposit":"1af6b77d-4dac-4fc8-b7ef-ec440a401d65"},"_deposit":{"created_by":1,"id":"65659","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"65659"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00065659","sets":["10:29"]},"author_link":["646768","646769","646773","646770","646766","646772","646774","646767","646771"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2015-04-19","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"１．背景・目的\n製品評価技術基盤機構が発行するJCT-21007技術的要求事項適用指針（適用指針）準拠の標準電位計で決定した電荷は，校正のための絶対値となり得る．しかし適用指針は，ユーザ電位計を比較校正する際の測定対象となる電荷（測定電荷）にまで言及していない．\n測定電荷の組み立て方法は，A）直流電流×時間（Q=I×t）及びB）静電容量×直流電圧（Q=C×V）の2通りが考案できる1-3)．方法Aは多種の電位計，大電荷の組み立てに対応でき4)，二次校正機関での量産的な校正に適しているが，方法Bより不安定と考えられる．そこで測定電荷をA及びBの方法で組み立て，比較した．\n２．方法\n直流電流発生装置にはKEITHLEY6430，時間制御にはExcelを用いた．電流印加のON/OFFはリレースイッチで制御した．また信号源キャパシタには川口電機製作所製の空気キャパシタ，直流電圧発生装置にはADCMT6161を用いた．電荷の大きさはnCオーダとした．\nまず，2つの方法で組み立てた測定電荷の絶対値は，標準電位計でそれぞれ決定した．次に，ユーザ電位計模擬のKEITHLEY6517で測定電荷を計測し，方法AとBとで6517の電位計校正定数を比較した．\n当分離校正による校正定数の妥当性は，同一の電離箱31010（PTW）を標準電位計及び6517それぞれに接続し電離箱校正を行い，6517の電位計校正定数と標準電位計での電離箱校正定数の積を，6517での電離箱校正定数（一体校正に相当）と比較することで検証した．\n３．結果・考察\n標準電位計による計測値のばらつきから，方法Aで組み立てた測定電荷の安定性は，方法Bより劣った．\n方法Aでの6517の電位計校正定数は，方法Bの場合と0.1%以内で一致した．一方，方法Aでの6517の直線性は，方法Bの場合と比べて1桁も劣った．今後の課題として，方法Aでの測定電荷の安定性向上が挙げられる．\n測定電荷の組み立て方法にかかわらず，6517の電位計校正定数と標準電位計での電離箱校正定数の積は，6517での電離箱校正定数と0.1%以内で一致した．\n４．結論\n電位計比較校正時に標準電位計及びユーザ電位計の測定対象となる電荷を2つの方法で組み立て，分離校正を行った．その結果，方法による電位計校正定数の違いは有意でなかった．今後，量産校正に適した直流電流×時間の方法を基本に，電位計校正体制を構築する．","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第109 回日本医学物理学会学術大会","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"高瀬, 信宏"}],"nameIdentifiers":[{"nameIdentifier":"646766","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"佐方, 周防"}],"nameIdentifiers":[{"nameIdentifier":"646767","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"水野, 秀之"}],"nameIdentifiers":[{"nameIdentifier":"646768","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"福村, 明史"}],"nameIdentifiers":[{"nameIdentifier":"646769","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"al., et"}],"nameIdentifiers":[{"nameIdentifier":"646770","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"高瀬 信宏","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"646771","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"佐方 周防","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"646772","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"水野 秀之","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"646773","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"福村 明史","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"646774","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"Development of a separated calibration system for electrometer and ionizing chamber (2): Charge for comparative calibration","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Development of a separated calibration system for electrometer and ionizing chamber (2): Charge for comparative calibration"}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-05-19"},"publish_date":"2015-05-19","publish_status":"0","recid":"65659","relation_version_is_last":true,"title":["Development of a separated calibration system for electrometer and ionizing chamber (2): Charge for comparative calibration"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:57:40.706445+00:00"}