{"created":"2023-05-15T14:47:51.809834+00:00","id":65618,"links":{},"metadata":{"_buckets":{"deposit":"b6811e4a-e31b-47fb-8276-253c951e5e17"},"_deposit":{"created_by":1,"id":"65618","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"65618"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00065618","sets":["10:29"]},"author_link":["646288","646286","646287","646293","646290","646285","646292","646289","646291"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2015-03-30","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"CR-39は陽子線や重粒子線測定において高い感度を持つ固体飛跡検出器の素材として非常に有名である。重粒子線照射によってCR-39内に形成された潜在飛跡は化学エッチング処理によってエッチピットとして拡大形成される。CR-39の数々のすばらしい利用に対して、照射による潜在飛跡形成とエッチング過程のメカニズムは解決されないままである。本研究では、結合の破壊によって形成された分子フラグメントを質量分析法により同定することを試みた。飛行時間型質量分析のイオン化法として、マトリックス支援レーザー脱離イオン化法（MALDI）とナノ構造支援レーザー脱離イオン化法（NALDI）の2つのソフトなイオン化法を使用した。これまでに得られているCR-39ポリマーが溶出したエッチング溶液中に含まれる質量分布ならびに各々のイオン化法について検討した結果を報告する。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第29回固体飛跡検出器研究会","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"井原, 大輔"}],"nameIdentifiers":[{"nameIdentifier":"646285","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小平, 聡"}],"nameIdentifiers":[{"nameIdentifier":"646286","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"川嶋, 元"}],"nameIdentifiers":[{"nameIdentifier":"646287","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"内堀, 幸夫"}],"nameIdentifiers":[{"nameIdentifier":"646288","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"高橋, 正"}],"nameIdentifiers":[{"nameIdentifier":"646289","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"井原 大輔","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"646290","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小平 聡","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"646291","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"川嶋 元","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"646292","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"内堀 幸夫","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"646293","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"質量分析法を用いた高分子材料中に生じる放射線損傷検出法の研究","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"質量分析法を用いた高分子材料中に生じる放射線損傷検出法の研究"}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-04-14"},"publish_date":"2015-04-14","publish_status":"0","recid":"65618","relation_version_is_last":true,"title":["質量分析法を用いた高分子材料中に生じる放射線損傷検出法の研究"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:58:06.406682+00:00"}