{"created":"2023-05-15T14:47:51.743029+00:00","id":65617,"links":{},"metadata":{"_buckets":{"deposit":"147cf6c8-5c68-4a55-a309-ff7e9ada4023"},"_deposit":{"created_by":1,"id":"65617","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"65617"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00065617","sets":["10:29"]},"author_link":["646282","646273","646275","646281","646277","646274","646284","646278","646276","646283","646280","646279"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2015-03-30","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"これまでに高閾値固体飛跡検出器としてPETやポリイミドについて、入射エネルギーが6 MeV/n以下の重イオン照射実験が体系的に行われてきた。しかし高いエネルギー域の応用分野に対応するため、本研究ではポリイミド樹脂のKaptonに、入射エネルギーが400 MeV/n以下のKrイオン、290 MeV/n以下のXeイオンを照射し、赤外分光法を用いて損傷構造を分析することを目的とした。Kaptonの主鎖を担うジフェニルエーテル、C=O、C-N-Cについて、照射前後の吸光度の比から放射線化学収率を含むいくつかの化学的損傷パラメータを算出し、損傷を評価した。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第29回固体飛跡検出器研究会","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"池永, 龍之介"}],"nameIdentifiers":[{"nameIdentifier":"646273","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"楠本, 多聞"}],"nameIdentifiers":[{"nameIdentifier":"646274","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小田, 啓二"}],"nameIdentifiers":[{"nameIdentifier":"646275","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小平, 聡"}],"nameIdentifiers":[{"nameIdentifier":"646276","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"北村, 尚"}],"nameIdentifiers":[{"nameIdentifier":"646277","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"山内, 知也"}],"nameIdentifiers":[{"nameIdentifier":"646278","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"池永 龍之介","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"646279","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"楠本 多聞","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"646280","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小田 啓二","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"646281","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小平 聡","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"646282","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"北村 尚","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"646283","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"山内 知也","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"646284","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"Xeイオン(290 MeV/n), Krイオン(400 MeV/n)を照射したポリイミドの損傷構造","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Xeイオン(290 MeV/n), Krイオン(400 MeV/n)を照射したポリイミドの損傷構造"}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-04-14"},"publish_date":"2015-04-14","publish_status":"0","recid":"65617","relation_version_is_last":true,"title":["Xeイオン(290 MeV/n), Krイオン(400 MeV/n)を照射したポリイミドの損傷構造"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T20:58:07.074109+00:00"}