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アイテム
CR-39飛跡検出器におけるREL基準に適合するデルタ線カットオフエネルギーの実験的検証
https://repo.qst.go.jp/records/64636
https://repo.qst.go.jp/records/64636dd90507e-dc1c-488b-b098-12e7686f5b4f
| アイテムタイプ | 会議発表用資料 / Presentation(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2012-06-22 | |||||
| タイトル | ||||||
| タイトル | CR-39飛跡検出器におけるREL基準に適合するデルタ線カットオフエネルギーの実験的検証 | |||||
| 言語 | ||||||
| 言語 | jpn | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_c94f | |||||
| 資源タイプ | conference output | |||||
| アクセス権 | ||||||
| アクセス権 | metadata only access | |||||
| アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
| 著者 |
小平, 聡
× 小平, 聡× その他× 小平 聡 |
|||||
| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | We studied the track response of CR-39 plastic nuclear track detectors (PNTD) for low (<6 MeV/n) and high (>100 MeV/n) energy heavy ions using the atomic force microscope (AFM). CR-39 PNTD was exposed to several heavy ion beams of different energy at HIMAC. For AFM measurement, the amount of bulk etch was controlled to be ~2 um in order to avoid etching away of short range tracks. The response data obtained by AFM for ~2 um bulk etch was in good agreement with data obtained by the conventional optical microscope analysis for larger bulk etch. The response data from low energy beams (stopping near the surface) was also consistent with the data from high energy beams (penetrating the detector) as a function of REL (restricted energy loss) with the delta-ray cut off energy of w0 =200 eV. We experimentally verified that REL (w0 =200 eV) gives a universal function for wide energy range in CR-39 PNTD. | |||||
| 会議概要（会議名, 開催地, 会期, 主催者等） | ||||||
| 内容記述タイプ | Other | |||||
| 内容記述 | 第26回固体飛跡検出器研究会 | |||||
| 発表年月日 | ||||||
| 日付 | 2012-03-29 | |||||
| 日付タイプ | Issued | |||||
