{"created":"2023-05-15T14:46:30.781916+00:00","id":63826,"links":{},"metadata":{"_buckets":{"deposit":"f3a6a977-7653-4bbd-a7b4-db164fadc3fe"},"_deposit":{"created_by":1,"id":"63826","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"63826"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00063826","sets":["10:29"]},"author_link":["629638","629635","629636","629637"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2009-10-30","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Repair of DNA double strand break plays very important roles in radiobiological effects, rather than induction of initial breaks. However the detail of the repair system and cell killing at high LET beams is still not well known. We studied the LET dependence of sensitivity on Chicken DT-40 cell lines; ku70<sup>-/-</sup> (NHEJ deficient), rad54<sup>-/-</sup> (HRR deficient), ku70<sup>-/-</sup>rad54<sup>-/-</sup> (double deficient), and wild cells using ion-beams from the Heavy Ion Medical Accelerator in Chiba at NIRS. \nThe double deficient strain showed the steepest survival curve, HRR deficient strain follows, and wild strain was the third. The NHEJ deficient strain showed a double phased survival curve. The initial part of the curve was extremely same to that of the double deficient strain. The final part of the curve was much more resistant compare with that of wild strain. The RBEs for repairable strains showed a typical LET dependence, i.e., RBE increase with LET, show a peak at around 200 keV/&mu;m, and then decrease. However, that for irreparable strains does not showed a peak of RBE, and simply decreased with LET above 100 keV/&mu;m, as well as initial yield of DNA dsb in cells. \nWe can conclude that the repair causes the peak of LET-RBE from the difference in LET-RBE spectrum between cell strains that have different repair system but the same genetic background.","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"MICROS 2009 - 15th International Symposium on Microdosimetry","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Furusawa, Yoshiya"}],"nameIdentifiers":[{"nameIdentifier":"629635","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Aoki, Mizuho"}],"nameIdentifiers":[{"nameIdentifier":"629636","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"古澤 佳也","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"629637","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"青木 瑞穂","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"629638","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"Misrepair of DNA Double Strand Breaks Causes the Peak of LET-RBE Relationship on Cell Killing","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Misrepair of DNA Double Strand Breaks Causes the Peak of LET-RBE Relationship on Cell Killing"}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2010-03-05"},"publish_date":"2010-03-05","publish_status":"0","recid":"63826","relation_version_is_last":true,"title":["Misrepair of DNA Double Strand Breaks Causes the Peak of LET-RBE Relationship on Cell Killing"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T21:18:34.099478+00:00"}