{"created":"2023-05-15T14:46:26.468648+00:00","id":63730,"links":{},"metadata":{"_buckets":{"deposit":"bf81db8d-ed41-46d5-b040-a654890b5872"},"_deposit":{"created_by":1,"id":"63730","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"63730"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00063730","sets":["10:29"]},"author_link":["629038","629040","629031","629024","629028","629034","629025","629039","629033","629036","629026","629030","629027","629032","629035","629029","629023","629037"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2009-11-20","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"放医研のPIXE分析システムでは、近年、定量測定の要望が多くなってきた。そのためには、イオンビーム照射量の正確な測定が必要であるが、Microbeam Scanning PIXE Line(m-PIXE)では、試料毎の形状や厚み、電導率等の違いにより試料から照射量（ビーム電流積算値）を正確に測定することは難しかった。更に、ビームをスキャンさせているためより一層難しい。そのため、定量測定技術開発の第1段として試料の状態に依らず照射量を間接的に測定できる二次電子を利用したリアルタイムビーム電流測定装置の開発を開始した。 　薄膜を利用しビームが薄膜を透過するときに発生する2次電子の量を測定し、その量から実ビーム照射量を測定するものである。\n今回開発を行っているm-PIXEの構成図を図1に示す。quadrupole magnetとサンプルの間のビーム軌道上部にCeramic Channel Electron Multiplier (CEM )を取り付けた。二次電子の発生体としてPIXE分析に影響を与えにくいカーボン蒸着膜10 μg/cm2（計算上約50 nm）をサンプルの直前に設置し、サンプルの影響を受けずに測定が可能となっている。現在、予備実験中であるが、その途中経過を報告する。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第26回PIXEシンポジム　-第3回共用施設（PASTA＆SPICE）共同研究成果報告会-","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"石川, 剛弘"}],"nameIdentifiers":[{"nameIdentifier":"629023","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"磯, 浩之"}],"nameIdentifiers":[{"nameIdentifier":"629024","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"及川, 将一"}],"nameIdentifiers":[{"nameIdentifier":"629025","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小西, 輝昭"}],"nameIdentifiers":[{"nameIdentifier":"629026","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"北村, 尚"}],"nameIdentifiers":[{"nameIdentifier":"629027","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"樋口, 有一"}],"nameIdentifiers":[{"nameIdentifier":"629028","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"酢屋, 徳啓"}],"nameIdentifiers":[{"nameIdentifier":"629029","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"濱野, 毅"}],"nameIdentifiers":[{"nameIdentifier":"629030","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"今関, 等"}],"nameIdentifiers":[{"nameIdentifier":"629031","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"石川 剛弘","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"629032","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"磯 浩之","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"629033","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"及川 将一","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"629034","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小西 輝昭","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"629035","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"北村 尚","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"629036","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"樋口 有一","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"629037","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"酢屋 徳啓","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"629038","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"濱野 毅","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"629039","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"今関 等","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"629040","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"Micro scanning PIXEにおける照射量測定システムの開発　その１","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Micro scanning PIXEにおける照射量測定システムの開発　その１"}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-12-11"},"publish_date":"2009-12-11","publish_status":"0","recid":"63730","relation_version_is_last":true,"title":["Micro scanning PIXEにおける照射量測定システムの開発　その１"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T21:19:37.642990+00:00"}