{"created":"2023-05-15T14:46:10.946271+00:00","id":63083,"links":{},"metadata":{"_buckets":{"deposit":"dc90ceb6-3ae7-4a99-b9af-f65a1a52ff9e"},"_deposit":{"created_by":1,"id":"63083","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"63083"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00063083","sets":["10:29"]},"author_link":["623151","623149","623150","623152"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2009-07-12","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"これまで黒曜石フィッショントラック年代測定（ＦＴ法）ではウランの核分裂飛跡を光学顕微鏡で観察していた。その際に問題となるのは，各視野ごとの画像の取り込みと，画像のデータベースとの照合である（指紋の照合と類似）。今回，高精度化・客観化を図るために考えていることは，原子間力顕微鏡を用いて，黒曜石および，表面を模したフィルム表面を画像化することである。画像データベースと照合して，真正飛跡があると自動的に判定された視野だけを選んで経験を積んだ研究者が最終的に判断するようにすれば，著しく省力化が図れるだろう。この意味で，この装置は，“半自動化”である。以上を踏まえて今回の発表では，原子間力顕微鏡(AFM)を用いた黒曜石表面を紹介し，今後の展望について述べる。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"日本文化財科学会第26回大会","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"渡邉, 圭太"}],"nameIdentifiers":[{"nameIdentifier":"623149","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小西, 輝昭"}],"nameIdentifiers":[{"nameIdentifier":"623150","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"鈴木, 正男"}],"nameIdentifiers":[{"nameIdentifier":"623151","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小西 輝昭","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"623152","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"ＦＴ法の半自動測定に向けた原子間力顕微鏡(AFM)による黒曜石表面分析","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"ＦＴ法の半自動測定に向けた原子間力顕微鏡(AFM)による黒曜石表面分析"}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-05-18"},"publish_date":"2009-05-18","publish_status":"0","recid":"63083","relation_version_is_last":true,"title":["ＦＴ法の半自動測定に向けた原子間力顕微鏡(AFM)による黒曜石表面分析"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T21:23:23.745106+00:00"}